RTS200 RFID Test Set - RFID Webshop

The next table shows the test conditions in the Machine Configuration files.
Property name Description Comments
TEST CONDITIONS
RESULT_FAIL_LEVEL
Level of RESULT signal when
FAIL condition
Binary number with 8 bits. Each bit describes the polarity of the result line for the
corresponding antenna
EOT_ACTIVE_EDGE Active edge for EOT signal FALLING or RISING are possible values
TRIGGER_ACTIVE_EDGE Edge active for trigger signal FALLING or RISING are possible values
RESULT_ACTIVE
T_RESULT_ACTIVE
N_RESULT_DELAY
ST_YIELD_SAMPLES
RESULT2_LEVEL
N_RESULT2_DELAY
Condition of result to become
active
Time the RESULT signals
remain active
Delay for output in number of
tags
Tags to be considered for
Short term yield calculation
Active level for RESULT2
signal
Delay for output 2 in number
of tags
PASS, FAIL, BOTH or NONE are possible values
In ms
Describes the delay in terms of number of tags for the corresponding output signal to
be generated after the test has been made
The system will consider the last ST_YIELD_SAMPLES transponder for short term
yield calculation
HIGH or LOW to activate the RESULT2 signal (additional FAIL indication) to 1 or to
0 when there is a FAIL condition
Same meaning as N_RESULT_DELAY for RESULT2 output (additional FAIL
indication)
A nnex 2.1 Write Format Definition
Some protocols include the possibility of encoding the information into the tag chip memory. For
instance, the RTS200 current version supports ISO15693 and ISO14443-A writing operations.
There are two Test Suites supplied as example for writing:
• Write_Mifare.tsu
• Write_ISO15693.tsu
One block of information is written. The data to be written is specified as a string of hexadecimal
information, in the parameter WRITE_DATA of the test suite:
WRITE_DATA
05A1A2A3A4
The first hexadecimal byte (05 in the example) defines the block number to write (block 5 in this
case), while the rest of the string defines the actual data to write (hexadecimal bytes A1, A2, A3
and A4 in this case).
There are some special cases for information that is not mapped in the memory chip address
space. For instance, to activate or deactivate the SLI EAS bit, the block number has to be
specified as FF, and the data has to be FF to activate and 00 to deactivate the bit.
If writing more than one block is needed, it is possible to build a special test suite including as
many test files (.tst) as needed. Each test file has to include one WRITE_DATA parameter with the
information to write on a particular block (remember that the parameter in the test has precedence
over the same parameter if it is defined on the test suite also).
Pag: 35 Document: RTS200 RFID Test Set Code: 001.0036 Version: 1