RTS200 RFID Test Set - RFID Webshop

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The next table shows the set of properties defined for the current RTS200 version for functional tests. Property name Description Comments TEST CONDITIONS TEST_TYPE Type of test to be performed TST_READ_TAG Read test * Tests marked with (*) are not implemented in the firmware. They are only intended for laboratory use TST_FAST_READ TST_WRITE_TAG Fast read test (no decoding) Write test TST_READ_THRS* Read Threshold TAG_TYPE Type of chip (protocol) to use ISO_15693, ISO14443_A_MIFARE, PHILIPS_ICODE, UHF_EPC_CLASS_1_SLOW, UHF_EPC_CLASS_1_FAST, UHF_ISO_18000_6B INICADDR Initial address The starting tag memory address LENGTH Length in bytes Number of bytes in tag memory to perform the test TX_FREQ Carrier frequency for the test Sometimes not the standard carrier, but the optimal for the tag RX_FREQ Reception frequency Frequency where the receiver is tuned (See note below) MOD_INDEX Modulation Index Selected modulation index for the test N_SAMPLES Samples Number of samples to digitize the tag answer TRIES Number of times to test Repeats until NTRIES if the test is not successful. 0 means Level Trigger, that is, the test will be repeated until a good result is obtained or the trigger signal goes back to its original state. TEST_PERIOD Periodicity of test The test is performed every TEST_PERIOD tests POSDET_FILTER IF_BANDWIDTH VIDEO_FILTER (for compatibility reasons) Post-detection filter The post-detection filter bandwidth. It can take the values 100 Hz, 1 KHz, 10 KHz, 25 KHz, 50 KHz, 75 KHz, 100 KHz, 150 KHz or 200 Khz. (Any of the three property names are valid and equivalent) REFERENCE_LEVEL Analyzer ref. Level In voltage units (V, mV, uV, ...) DEMOD_GAIN Gain of the demodulator In dB ATTENUATOR Input attenuator Selection of input attenuator. 0dB-70dB in 10dB steps DETECTOR Demodulator Only Linear option can be selected here IF_BANDWIDTH IF filter bandwidth Only 100KHz option can be selected here TEST_ANTENNA_TYPE Model of antenna to use TESPR1000,TESPR1001,TESPR1002,TESPR1003 DISTANCE_TO_ANTENNA Antenna-tag distance Used to control Field level in tag with precision TRACKING_GENERATOR Enabling of tracking ON/OFF RF_GENERATOR_ENABLED Enabling of tracking generator ON/OFF WRITE_DATA Data to be written into the tag For personalization. See below for format description CHECK_CRC YIELD_THRESHOLD_LT YIELD_THRESHOLD_ST TEST LIMITS Enable or disable CRC checking Long term yield threshold (defined in test suite) Short term yield threshold (defined in test suite) To be used for debugging purposes, or when the tag has not been initialized with the right CRC value. For lower values of LT yield, a red alarm indication appears on screen For lower values of ST yield, a red alarm indication appears on screen RESULT TYPE Type of result of the test Int, string, bool (usually string for functional tests) LIMIT_MIN_FRQ Freq. Lower limit for test Minimum frequency measurement to consider the test valid LIMIT_MAX_FRQ Freq. Upper limit for test Maximum frequency measurement to consider the test valid LIMIT_MIN_LEV Level lower limit for test Minimum level measurement to consider the test valid LIMIT_MAX_LEV Level upper limit for test Maximum level measurement to consider the test valid Pag: 34 Document: RTS200 RFID Test Set Code: 001.0036 Version: 1
The next table shows the test conditions in the Machine Configuration files. Property name Description Comments TEST CONDITIONS RESULT_FAIL_LEVEL Level of RESULT signal when FAIL condition Binary number with 8 bits. Each bit describes the polarity of the result line for the corresponding antenna EOT_ACTIVE_EDGE Active edge for EOT signal FALLING or RISING are possible values TRIGGER_ACTIVE_EDGE Edge active for trigger signal FALLING or RISING are possible values RESULT_ACTIVE T_RESULT_ACTIVE N_RESULT_DELAY ST_YIELD_SAMPLES RESULT2_LEVEL N_RESULT2_DELAY Condition of result to become active Time the RESULT signals remain active Delay for output in number of tags Tags to be considered for Short term yield calculation Active level for RESULT2 signal Delay for output 2 in number of tags PASS, FAIL, BOTH or NONE are possible values In ms Describes the delay in terms of number of tags for the corresponding output signal to be generated after the test has been made The system will consider the last ST_YIELD_SAMPLES transponder for short term yield calculation HIGH or LOW to activate the RESULT2 signal (additional FAIL indication) to 1 or to 0 when there is a FAIL condition Same meaning as N_RESULT_DELAY for RESULT2 output (additional FAIL indication) A nnex 2.1 Write Format Definition Some protocols include the possibility of encoding the information into the tag chip memory. For instance, the RTS200 current version supports ISO15693 and ISO14443-A writing operations. There are two Test Suites supplied as example for writing: • Write_Mifare.tsu • Write_ISO15693.tsu One block of information is written. The data to be written is specified as a string of hexadecimal information, in the parameter WRITE_DATA of the test suite: WRITE_DATA 05A1A2A3A4 The first hexadecimal byte (05 in the example) defines the block number to write (block 5 in this case), while the rest of the string defines the actual data to write (hexadecimal bytes A1, A2, A3 and A4 in this case). There are some special cases for information that is not mapped in the memory chip address space. For instance, to activate or deactivate the SLI EAS bit, the block number has to be specified as FF, and the data has to be FF to activate and 00 to deactivate the bit. If writing more than one block is needed, it is possible to build a special test suite including as many test files (.tst) as needed. Each test file has to include one WRITE_DATA parameter with the information to write on a particular block (remember that the parameter in the test has precedence over the same parameter if it is defined on the test suite also). Pag: 35 Document: RTS200 RFID Test Set Code: 001.0036 Version: 1
Page 1 and 2: TAGnology RFID GmbH | Grazer Vorsta
Page 3 and 4: T a b le of Contents 1 INTRODUCTION
Page 5 and 6: 2 Getting Star t e d 2 .1 Softw a r
Page 7 and 8: 2.2.3 Software Configuration The IB
Page 9 and 10: • If it does not appear it usuall
Page 11 and 12: The Object Inspector form (in the l
Page 13 and 14: 3 Menu Options 3 .1 Context Sensiti
Page 15 and 16: corresponding to this option, accor
Page 17 and 18: 4 Ta g Analysis The Tag Analyzer wi
Page 19 and 20: RF Output Disabled (the value of th
Page 21 and 22: The test results section shows the
Page 23 and 24: The Traces controls in this section
Page 25 and 26: The test suite structure is describ
Page 27 and 28: All the common test files are usual
Page 29 and 30: The Pause button is used to make ad
Page 31 and 32: 6.1.5 GENERATED FILES There are two
Page 33: ANNEX 2 T EST PROPERT IES The next

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