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PISCES-2ET and Its Application Subsystems - Stanford Technology ...

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DUET Carrier Transport Model<br />

κ n<br />

=<br />

nk B T n µ n P<br />

(2.23)<br />

κ p<br />

= pk B T p µ p P<br />

(2.24)<br />

It is apparent that the carrier mobility, µ, is the key parameter to other transport coefficients, <strong>and</strong> the<br />

mobility can be obtained either from the theoretical calculation or more often through empirical or<br />

semi-empirical formulation by fitting the analysis/simulation results to the experimental data. We will<br />

discuss in a great detail the mobility modeling in CHAPTER 3. Finally, the rate of net loss of carrier<br />

kinetic energy is modeled as follows:<br />

3<br />

3<br />

u wn = -- ( u<br />

2 SRH + u rad )k B T n – ( u n, Auger – g nimp , ) E g ( T L ) + --k<br />

2 B T p –<br />

3<br />

w<br />

--g k<br />

2 B T n ( T n ) – w n ( T L )<br />

n – ----------------------------------------<br />

pimp ,<br />

τ wn<br />

(2.25)<br />

3<br />

3<br />

u wp = --( u<br />

2 SRH + u rad )k B T p – ( u p, Auger – g pimp , ) E g ( T L ) + --k<br />

2 B T n –<br />

3<br />

w<br />

--g k<br />

2 B T p ( T p )–<br />

w p ( T L )<br />

p – -----------------------------------------<br />

nimp ,<br />

τ wp<br />

(2.26)<br />

where u SRH , u rad , <strong>and</strong> u Auger are net carrier loss rates due to SRH, Auger, <strong>and</strong> radiative<br />

recombinations, respectively, g imp is the generation rate due to the impact ionization (II). Note that for<br />

both Auger recombination <strong>and</strong> II, we need to distinguish if they are caused by electrons or holes. The<br />

last term on RHS of each above expression represents the energy exchange between the carriers <strong>and</strong><br />

lattice.<br />

A special case for the above general description (Eqs. (2.15)-(2.17)) is when only the lattice<br />

temperature is of concern, i.e., the carriers can be considered to have the same temperature as the<br />

lattice. Such a scenario is often encountered in, say, the simulation of power devices. We can then lump<br />

Eqs. (2.15)-(2.17) by requiring all temperatures being the same (designated T) <strong>and</strong> need to solve the<br />

following thermal diffusion equation only.<br />

∂ 3<br />

----- c (2.27)<br />

∂t L + --( n+<br />

p)k ⎝<br />

⎛ 2<br />

B ⎠<br />

⎞ T = ∇ ⋅ ( κL ∇T – s – s ) + j n p n ⋅ E n + j p ⋅ E p + u SRH E g ( T )<br />

Together with Poisson’s (Eq. (2.12)) <strong>and</strong> carrier continuity equations (Eqs. (2.13)-(2.14)), these four<br />

equations are solved for four state variables: ψ, n, p, <strong>and</strong> T (for both lattice <strong>and</strong> carriers).<br />

<strong>PISCES</strong>-<strong>2ET</strong> – 2D Device Simulation for Si <strong>and</strong> Heterostructures 11

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