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PISCES-2ET and Its Application Subsystems - Stanford Technology ...

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CHAPTER 4<br />

Material Properties for<br />

Heterostructures<br />

In CHAPTER 2 <strong>and</strong> APPENDIX A, expressions are introduced for carrier transport in<br />

heterostructures. In order to perform the simulation, essential material parameters must be known. In<br />

this chapter, we will mainly discuss various material properties needed for device simulation <strong>and</strong> their<br />

dependence on the composition.<br />

4.1 Material Parameters for Device Simulation<br />

Material parameters in compound semiconductors depend strongly on the composition as well as (to a<br />

lesser degree) on the doping level. We start with identifying which material properties (parameters)<br />

are mostly concerned in the device simulation <strong>and</strong> then discuss the composition dependence in terms<br />

of mole fraction. Beside, the lattice temperature effect on some parameters will also be mentioned.<br />

The minimum set of material parameters which have to be known in order to proceed the<br />

device simulation include:<br />

1. Electron affinity, χ , <strong>and</strong> conduction b<strong>and</strong> edge offset due to the composition change.<br />

2. Energy b<strong>and</strong>gap, E g .<br />

* *<br />

3. Effective masses for electrons <strong>and</strong> holes, m n <strong>and</strong> m p , from which the effective densities of states<br />

for the conduction <strong>and</strong> valence b<strong>and</strong>s, N C <strong>and</strong> N V , can be derived (Eq. (2.4)).<br />

4. Static <strong>and</strong> high-frequency dielectric constants, <strong>and</strong> .<br />

ε 0<br />

ε ∞<br />

<strong>PISCES</strong>-<strong>2ET</strong> – 2D Device Simulation for Si <strong>and</strong> Heterostructures 33

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