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EGAS41 - Swansea University

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41 st EGAS CP 194 Gdańsk 2009<br />

Low energy-spread ion bunches from a laser-cooled gas<br />

M.P. Reijnders ∗ , N. Debernardi, G. Taban, S.B. van der Geer, P.H.A. Mutsaers,<br />

E.J.D. Vredenbregt, O.J. Luiten<br />

Department of Applied Physics, Eindhoven <strong>University</strong> of Technology,<br />

P.O Box 513, 5600 MB Eindhoven, The Netherlands<br />

∗ Corresponding author: M.P.Reijnders@tue.nl<br />

Pulsed and continuous ion beams are used in applications such as focused ion beams. The<br />

smallest achievable spot size in focused ion beam technology is limited by the monochromaticity<br />

of the ion source. Here we present energy spread measurements on a new concept,<br />

the ultra-cold ion source, which is based on near-threshold ionization of laser cooled atoms<br />

[1]. The low energy spread is important for focused ion beam technology because it enables<br />

milling and ion-beam-induced deposition at sub-nm length scales with many ionic<br />

species, both light and heavy.<br />

In the experiment, Rubidium atoms are captured in a magneto optical trap (MOT)<br />

inside an accelerator structure where they are ionized by a pulsed laser in a DC electric<br />

field. Time-of-flight measurements show two orders of magnitude lower energy spread than<br />

in the current industry standard reached with Gallium liquid-metal ion sources. Bunches<br />

with energy of only 5 eV can be produced with a root-mean-square energy spread as low<br />

as 0.02 eV. We show that the slowly moving, low-energy-spread ion bunches are ideal<br />

for studying intricate space charge effects in pulsed beams, i.e., the transition from space<br />

charge dominated dynamics to ballistic motion. [2]<br />

10<br />

1<br />

LMI source<br />

U [eV]<br />

0.1<br />

0.01<br />

12.6 fC<br />

2.8 fC<br />

0.41 fC<br />

0.11 fC<br />

0.026 fC<br />

1 10 100 1000<br />

U[eV]<br />

Figure 1: Measured energy spread σU as function of the beam energy U for various bunch<br />

charges (scatter plots), together with particle tracking simulations (dotted and solid curves).<br />

References<br />

[1] S.B. van der Geer et al., J. Appl. Phys. 102, 094312 (2007)<br />

[2] M.P. Reijnders et al., Phys. Rev. Lett. 102, 034802 (2009)<br />

254

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