Analysing spatial point patterns in R - CSIRO

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74 Tessellations Tile 1 Tile 2 Tile 3 Tile 4 Tile 5 Tile 6 Tile 7 0.17096279 0.09645337 0.02587679 0.18646932 0.15352600 0.07760811 0.03357145 Tile 8 Tile 9 Tile 10 0.01904539 0.15038824 0.08609854 Tessellations can be used to classify the points of a point pattern, in split.ppp, cut.ppp and by.ppp. If X is a point pattern and V is a tessellation, then cut(X,V) attaches marks to the points of X identifying which tile of V each point falls into; split(X,V) divides the point pattern into sub-patterns according to the tiles of V, and returns a list of the sub-patterns; by(X,V,FUN) divides the point pattern into sub-patterns according to the tiles of V, applies the function FUN to each sub-pattern, and returns the results as a list. > par(mfrow = c(1, 3)) > X plot(X) > Z plot(Z) > plot(cut(X, Z)) 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 > par(mfrow = c(1, 1)) X Z cut(X, Z) > plot(split(X, Z)) CopyrightCSIRO 2010
11.3 Operations involving a tessellation 75 split(X, Z) 1 2 3 4 5 6 7 8 9 10 11 12 14 16 13 15 If we plot two tessellations on the same spatial domain, what we see is another tessellation. The “intersection” (or “overlay” or “common refinement”) of two tessellations X and Y is the tessellation whose tiles are the intersections between tiles of X and tiles of Y. The command intersect.tess computes the intersection of two tessellations. > opa plot(X) > plot(Y) > plot(intersect.tess(X, Y)) > par(opa) X Y intersect.tess(X, Y) CopyrightCSIRO 2010
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Analysing spatial point patterns in
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CONTENTS 3 Contents PART I. OVERVIE
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CONTENTS 5 PART I. OVERVIEW The fir
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130 1.1 Types of data 7 The mark co
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1.2 Typical scientific questions 9
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1.2 Typical scientific questions 11
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13 We’ll cover both classical and
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2.4 Marks and covariates 15 Data ar
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2.4 Marks and covariates 17 example
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3.3 Contributed libraries for R 19
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4.4 Licence 21 The response will be
Page 23 and 24: 0.005 4.6 Exploratory data analysis
Page 25 and 26: 4.7 Models 25 E K(r) 0 500 1000 150
Page 27 and 28: 4.8 Multitype point patterns 27 4.8
Page 29 and 30: 4.8 Multitype point patterns 29 e.g
Page 31 and 32: 4.9 Installed datasets 31 PART II.
Page 33 and 34: 5.2 Classes in spatstat 33 Point pa
Page 35 and 36: 5.3 Return values 35 density(swedis
Page 37 and 38: 5.3 Return values 37 Many of the fu
Page 39 and 40: 6.2 Creating a ppp object 39 To rea
Page 41 and 42: 6.4 Categorical marks 41 longleaf T
Page 43 and 44: 6.6 Checking data 43 > par(mfrow =
Page 45 and 46: 45 7 Converting from GIS formats Th
Page 47 and 48: 8.1 Making windows by hand 47 8.1.3
Page 49 and 50: 8.2 Converting from GIS formats 49
Page 51 and 52: 8.5 Creating a point pattern in any
Page 53 and 54: 53 9 Manipulating point patterns Be
Page 55 and 56: 9.2 Operations on ppp objects 55 [1
Page 57 and 58: 9.2 Operations on ppp objects 57 ma
Page 59 and 60: 9.3 Example 59 You may also notice
Page 61 and 62: 9.5 List of operations on point pat
Page 63 and 64: 63 10 Pixel images in spatstat An o
Page 65 and 66: 10.2 Inspecting an image 65 > f w
Page 67 and 68: 10.2 Inspecting an image 67 > plot(
Page 69 and 70: 10.3 Manipulating images 69 0 200 6
Page 71 and 72: 71 > W V 3) > U 3, 42, Z)) Other
Page 73: 11.3 Operations involving a tessell
Page 77 and 78: 11.3 Operations involving a tessell
Page 79 and 80: 12.2 Inhomogeneous intensity 79 12.
Page 81 and 82: 12.2 Inhomogeneous intensity 81 den
Page 83 and 84: 13.3 Relative distribution estimate
Page 85 and 86: 1 1 2 4 4 1 2 13.4 Distance map 85
Page 87 and 88: 13.4 Distance map 87 PART IV. POISS
Page 89 and 90: 14.2 Quadrat counting tests for CSR
Page 91 and 92: 14.4 Kolmogorov-Smirnov test of CSR
Page 93 and 94: 14.5 Using covariate data 93 Becaus
Page 95 and 96: 95 15 Maximum likelihood for Poisso
Page 97 and 98: 15.3 Fitting Poisson processes in s
Page 99 and 100: 15.4 Fitted models 99 > ppm(bei, ~s
Page 101 and 102: 15.4 Fitted models 101 > predict(fi
Page 103 and 104: 15.4 Fitted models 103 effectfun(fi
Page 105 and 106: 15.5 Simulating the fitted model 10
Page 107 and 108: 16.2 Validation using residuals 107
Page 113 and 114: 113 PART V. INTERACTION Part V of t
Page 115 and 116: 115 independent + + + + + + + + + +
Page 117 and 118: 19.2 Empty space distances 117 Anot
Page 119 and 120: 19.2 Empty space distances 119 cell
Page 121 and 122: 19.2 Empty space distances 121 Fest
Page 123 and 124: 19.3 Nearest neighbour distances 12
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19.4 Pairwise distances and the K f
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19.4 Pairwise distances and the K f
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19.6 Manipulating and plotting summ
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19.7 Caveats 131 Kest(X) X K(r) 0.0
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20.1 Envelopes and Monte Carlo test
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139 21 Spatial bootstrap methods Sp
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22.2 Cox processes 141 22.2 Cox pro
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22.4 Sequential models 143 rSSI(0.0
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23.1 Fitting a cluster process 145
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23.4 Generic algorithm for minimum
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149 In data sharpening [27] the poi
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25.2 Inhomogeneous cluster models 1
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25.4 Local scaling 153 > data(bei)
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25.4 Local scaling 155 PART VI. GIB
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26.3 Pairwise interaction models 15
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26.4 Higher-order interactions 159
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26.6 Simulating Gibbs models 161 St
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27.2 Fitting Gibbs models in spatst
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27.3 Interpoint interactions 165 27
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27.4 Fitted point process models 16
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27.6 Dealing with nuisance paramete
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171 Stationary Strauss process Firs
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28.2 Residuals for Gibbs processes
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28.2 Residuals for Gibbs processes
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28.3 New methods 177 PART VII. MARK
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29.3 Methodological issues 179 A ma
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181 Chorley−Ribble Data For furth
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30.2 Inspecting a marked point patt
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30.3 Manipulating data 185 > data(l
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187 31 Exploratory tools for multit
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31.2 Simple summaries of neighbouri
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31.3 Distance methods and summary f
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31.4 Randomisation tests 197 31.4 R
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31.4 Randomisation tests 199 > plot
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32.1 Numeric marks: distribution an
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32.3 Reverse conditional moments 20
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33.2 Simulation 205 33.2 Simulation
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33.3 Fitting Poisson models 207 33.
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33.3 Fitting Poisson models 209 whe
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34.1 Gibbs models 211 34.1.3 Pairwi
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34.3 Fitting Gibbs models to multit
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34.3 Fitting Gibbs models to multit
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217 There are also the usual method
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219 lty col key label meaning iso 1
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221 38 Replicated data and hyperfra
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223 H H(r) 0.0 0.2 0.4 0.6 0.8 km h
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REFERENCES 225 References [1] F.P.
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REFERENCES 227 [32] P.J. Diggle. Bi
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Index analysis of deviance, 103 are
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INDEX 231 models, 25, 224 Monte Car
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