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Fatigue Crack Growth in 7050T7451 Aluminium Alloy Thick Section ...

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DSTO-TR-1477poorly def<strong>in</strong>ed areas on the fracture surface. The <strong>in</strong>teractive exam<strong>in</strong>ation of the crack surface is astrong advantage of this method, while the dependence of the result on the skill and consistencyof the fractographer may be a disadvantage as far as reproducibility is concerned.After the data have been collected and the flaw depth and <strong>in</strong>itial best-fit EPS have beenanticipated other methods were <strong>in</strong>vestigated to estimate EPS. These are listed below along withthe two prior types mentioned as measures of the flaw effectiveness. Each method has beendesignated as an EPS Type:Type I.‘Measured flaw depth’. This is usually the depth of the flaw at the po<strong>in</strong>t from whichcrack measurement was started, and has a level of uncerta<strong>in</strong>ty associated with theflaw shape and where along the edge of the flaw the measurements were startedfrom, as well as the position of the true surface; either the peaks between the peen<strong>in</strong>gdents or the base of the peen<strong>in</strong>g dents or somewhere between. (It should be notedthat this is not necessarily the deepest po<strong>in</strong>t of the flaw). In some historicalpresentations of this approach, particularly Barter et al, 1991 and Ath<strong>in</strong>iotis et al,1991 the measured flaw size was <strong>in</strong>cluded <strong>in</strong> the data and a exponential curve fit wasapplied (equation 1) to the data to determ<strong>in</strong>e the a o (zero life <strong>in</strong>tersect). Thisapproach, although not used here is designated as a Type IA EPS.Type II. The measure that was used dur<strong>in</strong>g the collection of the QF data, which was the‘anticipated EPS’. This measure is subjective and depends on the skill of thefractographer.Type III. Fitt<strong>in</strong>g the data to the exponential model (equation 1) us<strong>in</strong>g a curve fitt<strong>in</strong>g program,and optimis<strong>in</strong>g the <strong>in</strong>itial crack depth added to the raw crack size (offset value),check<strong>in</strong>g the ‘goodness of fit’ (R 2 value), and ref<strong>in</strong><strong>in</strong>g the depth added until themaximum R 2 is reached. This method could be used to produce the curve that bestfitted the total data, and gave a zero life <strong>in</strong>tercept value, which was thought to be thebest measure of the two possible EPSs (offset (Type IIIA) or <strong>in</strong>tercept (Type III)). Thismethod would produce an ‘optimised EPS’ for all the data which clearly was notappropriate here due to the non-s<strong>in</strong>gle exponential growth rate for the cracksgrow<strong>in</strong>g through the peen<strong>in</strong>g.Type IV. The data for each curve were divided <strong>in</strong>to two at the middle of the transition Phase(II) between the slower accelerat<strong>in</strong>g early Phase I of crack<strong>in</strong>g and the faster latterPhase III. The ‘anticipated EPS’ was <strong>in</strong>cluded <strong>in</strong> the early Phase I data <strong>in</strong> order togive an approximately correct start<strong>in</strong>g po<strong>in</strong>t and an exponential curve was fitted toPhase I data ignor<strong>in</strong>g the effect of the small amount of transition data <strong>in</strong>cluded. Thezero life <strong>in</strong>tersect of the curve a 0 was then used as the ‘fitted EPS’. This process wasdifferent to the process followed <strong>in</strong> Barter, 2003 (Type III EPS).While the Type III EPS is probably a more ref<strong>in</strong>ed method for growth curves that areclose to an exponential over their entire life, the amount of data to use <strong>in</strong> the case ofthe peened slopes needed to be considered carefully s<strong>in</strong>ce the optimisation rout<strong>in</strong>eused <strong>in</strong> the Type III EPS calculation, when applied to the early Phase I data,occasionally resulted <strong>in</strong> a runaway of the of the amount added s<strong>in</strong>ce the curve simplybecomes a more perfect exponential fit with greater additions when the data is notvery exponential <strong>in</strong> nature. This was particularly the case when the early part of thecurve is not entirely straight (log depth/l<strong>in</strong>ear life) such as some of the curves for the360MPa peak stress.22

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