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May 2013 - I-Micronews

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M A Y 2 0 1 3 I S S U E N ° 2 7<br />

YOLE ASKS<br />

Keeping up with the industry<br />

heavyweights<br />

IBM may have invented flip chip and Intel may have brought it to the worlds<br />

microprocessors, but FCT, through its low cost processing technologies brought<br />

it to hand held products in the early 2000’s.<br />

Ted Tessier, Chief<br />

Technical Officer,<br />

FlipChip International<br />

FlipChip Int (FCI) began in 1996 as FlipChip<br />

Technologies (FCT), a joint venture between<br />

Delco electronics and Kulicke and Soffa<br />

(K&S). By modifying the Delco flip chip (FC)<br />

process, FCT was able to develop and license what<br />

quickly became the standard for flip chip bumping<br />

across the world. All of the major assembly<br />

houses including Amkor, ASE, STATS ChipPAC and<br />

Siliconware ran the FCT process.<br />

In 1998 FCT developed and patented the worlds<br />

first wafer level chip sized package (WLCSP), the<br />

Ultra CSP TM . In the early 2000’s estimates were<br />

that > 80% of cell phones contained FC or WLP<br />

parts derived from FCT processes.<br />

In 2004 RoseStreet Labs, a private R&D company<br />

based in Phoenix acquired FCT and renamed it<br />

FlipChip Int. Through the years FCI has managed to<br />

stay abreast of leading edge technologies and keep<br />

up with the industry “heavyweights”. i<strong>Micronews</strong><br />

recently had the opportunity to have a one-on-one<br />

with current CTO Ted Tessier to see where they<br />

stood on copper pillar bumping (CPB).<br />

Yole Développement: Is your organization<br />

manufacturing CPB technology? If yes can<br />

you share how long you have been doing this<br />

and describe the technology for us?<br />

Ted Tessier: FCI’s Cu pillar bumping process was<br />

qualified in 2007 and in volume production since<br />

2011. We offer a Standard Cu Pillar Bump for<br />

applications with bump pitches of 150 microns or<br />

less and our Nano-Pillar TM technology intended for<br />

sub-100 micron pitch applications.<br />

Our proprietary and patent pending technology is<br />

based on a solder paste printed solder cap. This<br />

approach enables a very broad range of solder<br />

alloys to be used vs traditional electroplated<br />

solder caps used by our competitors. This allows<br />

the Cu Pillar bump to be readily tailored to the<br />

reliability requirements of particular applications (i.e.<br />

automotive, hand-held consumer products etc…). A<br />

broad range of solder options have been qualified<br />

including High-Pb, Sn/Pb eutectic, Sn/Ag eutectic,<br />

pure Sn as well as High and Low Ag solder caps.<br />

For SiP packaging, a single solder alloy solution<br />

such as SAC305 or SAC405 is enabled.<br />

Solder capped pillar bump provides substantially<br />

improved bump height uniformity as a result of<br />

the inherent ability of the paste printed cap to<br />

compensate for Cu pillar plating variation. This is<br />

particularly important in device applications that<br />

require a range of different pillar bump sizes to<br />

balance the localized on-chip interconnection<br />

density / finer pitch requirements with improved<br />

thermal performance by well-placed large racetrack<br />

or breadloaf shaped bumps.<br />

YD: Has CPB become mainstream technology ?<br />

TT: Cu pillar bump technology has been a<br />

mainstream technology in high performance<br />

microprocessors for many years. Over the past<br />

half decade or so, the adoption of Cu pillar bumping<br />

for mid-range device applications has become<br />

common. More recently, Cu pillar is starting to<br />

be adopted selectively within the RF space, most<br />

commonly for applications that require higher<br />

levels of electrical performance.<br />

FCI’s copper pillar bump coplanarity: across a broad range of bump sizes<br />

(Courtesy of FlipChip International)<br />

10<br />

3 D P a c k a g i n g

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