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May 2013 - I-Micronews

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I S S U E N ° 2 7 M A Y 2 0 1 3<br />

Cu RDL<br />

Copper post /<br />

barrier layer<br />

PI Encaspulant SiN Solder Ball<br />

Fujitsu SuperCSP (Courtesy of Fujitsu)<br />

The first descriptions of this concept were by<br />

Chanchani. The first commercialization of such a<br />

product was by FCT which introduced the UltraCSP<br />

in 1998. Over time the nomenclature changed from<br />

mini-BGA, to wafer level chip scale package (WL-<br />

CSP), to the simpler “wafer level package” or WLP.<br />

WLP was reviewed in 2000.<br />

Copper pillar technology<br />

The concept of copper pillar bump stems from the<br />

Fujitsu Super CSP package which placed solder<br />

on top of copper pillars to increase the standoff<br />

height of the solder bumps and thus the package<br />

reliability. In later years this concept was used<br />

to increase the density, reliability and electrical<br />

performance when compared to standard FC.<br />

In 2006, it was revealed that Intel had replaced<br />

its traditional SnPb flip chip solder bumps with a<br />

combination copper pillar/SnPb joint for its 65nm<br />

Yonah and Pressler processors. In 2010, Texas<br />

Instruments and Amkor announced the HVM of<br />

copper pillar flip chip packages.<br />

Dr. Phil Garrou for Yole Développement<br />

3DIC technology is seen today<br />

as a new paradigm for the future<br />

of the semiconductor industry<br />

2.5D, 3DIC and TSV Interconnect<br />

Patent Landscape Analysis<br />

Discover the NEW report on<br />

www.i-<strong>Micronews</strong>.com/reports

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