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Image sensor datasheet (PDF)

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Defect Definitions<br />

All values are derived under normal operating conditions at 40°C operating temperature.<br />

Defect Type<br />

Defect Definition<br />

Number<br />

Allowed<br />

Notes<br />

Defective Pixel<br />

Under uniform illumination with mean pixel output of<br />

400mV, a defective pixel deviates by more than 15% from<br />

5 1, 2, 3<br />

the mean value of all active pixels in its section<br />

Bright Defect<br />

Under dark field conditions, a bright defect deviates more<br />

than 15 mV from the mean value of all pixels in its section<br />

0 1, 2, 3<br />

Cluster Defect<br />

Two or more vertically or horizontally adjacent defective<br />

pixels<br />

0 2, 3<br />

Notes:<br />

1. Sections are 256 (H) x 242 (V) pixel groups, which divide the imager into six equal areas as shown below.<br />

2. For the color device, KAI-0373-EBA, a defective pixel deviates by more than 15% from the mean value of all active pixels in its section with the same<br />

color.<br />

3. Test conditions: Junction temperature = 40°C, integration time = 33 msec and readout time = 33 msec.<br />

(1,484)<br />

(768,484)<br />

(1,1) (768,1)<br />

©Eastman Kodak Company, 2006 www.kodak.com/go/imagers Revision 2.0 MTD/PS-0660 p11

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