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SESHA 2011 Program Book - Semiconductor Safety Association

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stakeholder events and solicits input from stakeholders<br />

for continuous improvement of the Code of Conduct.<br />

The Code of Conduct provides guidance in five critical<br />

areas of CSR performance: • Labor • Health and <strong>Safety</strong><br />

• Environment • Management System • Ethics<br />

11:30 am Lunch on your Own<br />

1:00-3:15 pm<br />

GHG<br />

Sonora C<br />

1:00 pm PCS PIRANHA Plasma Abatement System:<br />

Update of Evaluation on 300mm Etch Process<br />

Kopatzki, E, Guerin, J; CS Clean Systems<br />

Introduction by the EPA in mid 2010 of Reporting<br />

rules on greenhouse gases has led to a heightened level<br />

of interest in PFC reduction within the semiconductor<br />

and related industries. In view of the limited number of<br />

practical options available to the typical semiconductor<br />

manufacturing facility for the curtailment of CO2 equivalent<br />

emissions, PFC abatement offers a convenient<br />

route to more environmentally-friendly manufacturing<br />

as well as compliance with present and future EPA policies.<br />

The PCS PIRANHA plasma conversion system<br />

uses a 2kW or 3kW microwave plasma to decompose<br />

PFC gases into reactive fluorine/ fluoride species which<br />

are readily removed by a downstream scrubber. The unit<br />

is fitted inline within the vacuum foreline between the<br />

etch chamber exhaust and dry roughing pump. A 2.45<br />

GHz microwave is generated by a magnetron and conducted<br />

into the exhaust gas stream. This setup ensures<br />

that the full microwave power is focussed on the PFC<br />

gases prior to dilution by the N2 ballast of the dry pump,<br />

allowing very high PFC destruction efficiencies to be<br />

achieved. This presentation will discuss the results of<br />

current testing carried out using a 3kW pre-pump microwave<br />

plasma device. The evaluation is being carried out<br />

in conjunction with a vendor of Etch tools using stateof-the<br />

art 300 mm recipes over a wide range of PFC gas<br />

flows and foreline pressure regimes.<br />

1:45 pm Guideline for GHG Emission Measurement<br />

and Management<br />

Kagino, M; Toshiba, Tokyo Japan<br />

JEITA thinks that we need grasp of the amount of<br />

emission of F-GHG in order to advance a battle against<br />

global warming, and the technique of the suitable and efficient<br />

amount grasp of F-GHG emission contributes to<br />

progress of the battle. The IPCC 2006 guideline requests<br />

that the performance is measured and checked under a<br />

use situation as the conditions which can use a default<br />

value at the abatement efficiency of F-GHG abatement<br />

equipment. JEITA had already exhibited the guideline<br />

for measurement. Since JEITA revised this extensively<br />

this time, I will introduce this. This guideline provides<br />

the efficient measuring method and the management<br />

method such as time and frequency of the efficient measurement<br />

to users of the equipment which use F-GHG.<br />

And it will assist users to grasp exactly the amount of<br />

emission of F-GHG which oneself has discharged, and<br />

to make plan for reduction based on these results, and to<br />

carry out.<br />

2:30 pm Global Warming Evaluation of Chamber<br />

Cleaning Gases by New Indicators, CEWN and<br />

CETN<br />

Sekiya, A, Okamoto, S; National Institute of Advanced<br />

Industrial Science and Technology (AIST), Japan<br />

Dealing with the global warming is still big issue<br />

because the Earth temperature has been rising. <strong>Semiconductor</strong><br />

and liquid crystal industries have been used longlived<br />

fully fluorinated compounds that have high global<br />

warming effects. The long-term evaluation of global<br />

warming caused by the use of these gases has to be paid<br />

much more attentions. On the other hand, evaluation<br />

metric is quite important to get scientifically reliable<br />

results. In this paper, using LCCP (Life Cycle Climate<br />

Performance) data of our previous work, CVD chamber<br />

cleaning gases are evaluated by new global warming indicators,<br />

CEWN1) (Carbon Dioxide Equivalent Warming<br />

Number), CETN2) -(Carbon Dioxide Equivalent<br />

Temperature Change Number), and s-CETN2) (square-<br />

Carbon Dioxide Equivalent Temperature Change Number<br />

). CEWN evaluates based on radiative forcing as<br />

GWP3). CETN and s-CETN are based on the global<br />

surface temperature rise by Shine’s equation4). CEWN<br />

and CETN compare GHGs by unifying the removal rate<br />

of each gas from the atmosphere, while s-CETN unifies<br />

the ratio to the total amount of the global warming of<br />

each gas. They provide fair index of global warming to<br />

each GHG. LCCP data is analyzed using GWP, CEWN,<br />

CETN, and s-CETN and compared. Results show that<br />

CEWN, CETN, and s-CETN are as easy-to-use as GWP.<br />

Further, the relation of CEWN, CETN, s-CETN values<br />

with the climate impact is clearer than that of GWP<br />

values. According to those new indicators, the order of<br />

global warming is C2F6 > C3F8 > NF3>> COF2. In<br />

the case where 16% 5) of NF3 production releases into<br />

23

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