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SESHA 2011 Program Book - Semiconductor Safety Association

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will be highlighted. Point-of-Use (POU) abatement technologies<br />

overview will be provided. Important items to<br />

assist personnel in reducing maintenance and increasing<br />

uptime will detailed. The EPA Greenhouse Reporting<br />

Rule for electronics industry will be presented and any<br />

lessons learned provided. The EPA Testing Protocol for<br />

POU abatement device Destruction and Removal Efficiency<br />

(DRE) and the 2009 ISMI Testing Guideline will<br />

be presented. This overview will allow the attendee to<br />

understand how testing is conducted and how to work<br />

with testing suppliers.<br />

5

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