Section 6: Selected Applications & Techniques

2.0 Methods used for H.Temperature Scanning
2.1 Transducers- H.Temperature Delay Line Material
Panametrics-NDT high temperature transducers fall into two categories,
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dual element transducers and
delay line transducers.
In both cases, the delay line material (which is internal in the case of duals)
serves as thermal insulation between the active transducer element and the
hot test surface.
For design reasons, there are no high temperature contact or immersion
transducers in the standard product line. High temperature duals and delay
line transducers are available for both thickness gaging and flaw detection
applications. As with all ultrasonic tests, the best transducer for a given
application will be determined by specific test requirements, including the
material, the thickness range, the temperature, and in the case of flaw
detection, the type and size of the relevant flaws.