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5-6. Diffusion & Ion Implantation

5-6. Diffusion & Ion Implantation

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o Gas-source systems supply the dopant species directly to the furnace tube in the<br />

gaseous state.<br />

- The common gas sources are extremely toxic, and additional input purging and<br />

trapping systems are required to ensure that all the source gas is removed from<br />

the system before wafer entry or removal.<br />

- In addition, most diffusion processes either do not use all of the source gas or<br />

produce undesirable reaction by-products.<br />

- Therefore, the output of diffusion systems must be processed by burning or by<br />

chemical or water scrubbing before being exhausted into the atmosphere.<br />

o Boron is the only commonly used p-type dopant.<br />

- The diffusion coefficients of aluminum and gallium are quite high in Si dioxide,<br />

and there elements cannot be masked effectively by SiO₂.<br />

- Indium is not used, because it is a relatively deep-level acceptor.<br />

o Antimony, phosphorus, and arsenic can all be masked by Si dioxide and are all<br />

routinely used as n-type dopants in Si processing.<br />

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