5-6. Diffusion & Ion Implantation
5-6. Diffusion & Ion Implantation
5-6. Diffusion & Ion Implantation
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o Gas-source systems supply the dopant species directly to the furnace tube in the<br />
gaseous state.<br />
- The common gas sources are extremely toxic, and additional input purging and<br />
trapping systems are required to ensure that all the source gas is removed from<br />
the system before wafer entry or removal.<br />
- In addition, most diffusion processes either do not use all of the source gas or<br />
produce undesirable reaction by-products.<br />
- Therefore, the output of diffusion systems must be processed by burning or by<br />
chemical or water scrubbing before being exhausted into the atmosphere.<br />
o Boron is the only commonly used p-type dopant.<br />
- The diffusion coefficients of aluminum and gallium are quite high in Si dioxide,<br />
and there elements cannot be masked effectively by SiO₂.<br />
- Indium is not used, because it is a relatively deep-level acceptor.<br />
o Antimony, phosphorus, and arsenic can all be masked by Si dioxide and are all<br />
routinely used as n-type dopants in Si processing.<br />
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