+ R - Center for Nanoscale Systems - Harvard University
+ R - Center for Nanoscale Systems - Harvard University
+ R - Center for Nanoscale Systems - Harvard University
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Thin Film Characterization-1250 °CGrowthRMS:5.06nm250 °CGrowthRMS:4.69nmt = 62.6nmn = 2.48TiO 2 0114 As GrownZnO and TiO 2 Thin FilmDeposition on Si Using ALD(Mac Hathaway)TiO 2 0114 After 550 °C Anneal/30 Minutes150 °CGrowthRMS:1.08nmt = 24.6nmn = 2.24TiO 2 0404 After 550 °C Anneal 30 minutes