Probing Systems For Co-ordinate Measuring machines - Teknikel

Probing systems forco-ordinate measuring machinesHow to use this guideHow to use this guide1-1This TECHNICAL SPECIFICATIONS document is intendedto help you select the most appropriate probing system foryour CMM. The probing system includes the probe withstylus, the method of attachment of the probe to the CMMby use of a probe head or simple shank, and the necessaryprobe/head controlling interfaces.Probe system selectionBefore selecting the most appropriate probe system, youshould clearly understand the scope of measurementapplications to be addressed on your CMM. Renishaw’sproduct range covers all types of probing requirements,from simple touch-trigger point measurement through toadvanced part profi le scanning. Where a standard productproves not to be ideal, Renishaw’s custom design service isavailable to accommodate you requirements.This technical specifi cations document is divided intosections that focus on the different parts of the probingsystem and indicates the particular benefi ts of each product.The technical information for each product is also given sothat performance data can be compared where more thanone product appears suitable.Step-by-step selection procedureStep 1 (see sections 5, 6, 7 and 8)Systems suitable for your CMMQ? Which type of CMM do you have or wish to purchase?Manual CMM - go to sections 5/6 to see the family trees ofprobing systems that are suited to manual CMMs. Identifythe probe(s) and probe head(s) that are of interest, andthen proceed to steps 2 and 3 to fi nd out more informationon these products and fi nalise your selection.DCC CMM - go to sections 7/8 to see the family trees ofprobing systems that are suited to DCC CMMs. Identify theprobe(s) and probe head(s) that are of interest, and thenproceed to steps 2 and 3 to fi nd out more information onthese products and fi nalise your selection.NOTE: All probes shown in this document are suitable foruse on DCC CMMs.Step 2 (see sections 2/3/4)Probe selectionDetailed information on each probe is given in one of threesections as described below.Contact trigger probes (see sections 2 and 3)Discrete point, contact trigger probes (also calledtouch-trigger probes) are ideal for inspection of 3dimensional prismatic parts and known geometries. Theseprobes are highly versatile and are suitable for a diverserange of applications, materials and surfaces, and thereis a wide range of accessories available for them. Theprobes are segregated into two sections here - probeswithout, and probes with stylus module changing.Stylus module changing is a very important considerationas it enables higher productivity and the ability to alwaysselect the best measurement solution for the application.A further distinction between contact trigger probes istheir type of design. There are kinematic probes andelectronic probes to choose from. Probe sizes varydue to the features of the probe. The larger kinematicprobes are extremely robust and are very well suited tomanual CMMs due to their large overtravel capability. Thesmaller probes are suited to applications where there is aneed to access restricted spaces. Renishaw’s electronicprobes offer extended life suitable for high density pointprofi le measurement and also permit higher accuracythan kinematic probes. Depending on the type of CMMand the level of utility required, there is a choice betweenshank mounted, M8 thread or autojoint mounted probes.Renishaw’s autojoint mounted probes and extensionscan be rapidly interchanged for increased fl exibility andproductivity.Contact scanning probes (see section 4)Scanning is ideal for the inspection of geometric formsand full profi le measurement where thousands of datapoints can describe the form more fully than a few discretepoints. A large amount of information can be collected ina very short time giving better direct results. Renishaw’srange of fi xed and indexable type scanning probes offershigh accuracy, excellent robustness and low contact forcescanning. All Renishaw scanning probes feature rapidinterchange between stylus confi gurations to furtherincrease fl exibility and productivity.