Single-Chip Low Cost Low Power RF-Transceiver (Rev. B

CC25000x2B: AGCTEST – AGC TestBit Field Name Reset R/W Description7:0 AGCTEST[7:0] 63(0x3F)R/WFor test only. Do not write to this register.0x2C: TEST2 – Various Test SettingsBit Field Name Reset R/W Description7:0 TEST2[7:0] 136 (0x88) R/W Set to 0x81 for improved sensitivity at data rates ≤100 kBaud. Thetemperature range is then from 0 o C to +85 o C.0x2D: TEST1 – Various Test SettingsBit Field Name Reset R/W Description7:0 TEST1[7:0] 49 (0x31) R/W Set to 0x35 for improved sensitivity at data rates ≤100 kBaud. Thetemperature range is then from 0 o C to +85 o C.0x2E: TEST0 – Various Test SettingsBit Field Name Reset R/W Description7:2 TEST0[7:2] 2 (0x02) R/W The value to use in this register is given by the SmartRF ® Studiosoftware [5].1 VCO_SEL_CAL_EN 1 R/W Enable VCO selection calibration stage when 10 TEST0[0] 1 R/W The value to use in this register is given by the SmartRF ® Studiosoftware [5].32.3 Status Register Details0x30 (0xF0): PARTNUM – Chip IDBit Field Name Reset R/W Description7:0 PARTNUM[7:0] 128 (0x80) R Chip part number0x31 (0xF1): VERSION – Chip IDBit Field Name Reset R/W Description7:0 VERSION[7:0] 3 (0x03) R Chip version number.0x32 (0xF2): FREQEST – Frequency Offset Estimate from DemodulatorBit Field Name Reset R/W Description7:0 FREQOFF_EST R The estimated frequency offset (2’s complement) of the carrier.Resolution is F XTAL /2 14 (1.59 - 1.65 kHz); range is ±202 kHz to±210 kHz, dependent of XTAL frequency.Frequency offset compensation is only supported for 2-FSK;GFSK and MSK modulation. This register will read 0 whenusing OOK modulation.SWRS040B Page 82 of 92