Huygens Professional User Guide

Numerics2D images 28AaddressesIBM 6Scientific Volume Imaging B.V. 6Silicon Graphics Inc. 6Airy disk 23, 25, 26Bbackprojected pinhole distance 24backprojected pinhole size 23BioradMRC500/600/1024 26MRC500/600/1024/Radiance 26blacklevel 20bleaching 22bleaching correction 16brick 19Cclipping 10, 22computer memory 19computing the backprojected pinholediameter 23computing the backprojected pinholedistance 24computing time 19conversion into backprojected pinholesize 23critical sampling distance 21Ddeconvolution functions 3deconvolvinga single plane wide field image 28Tiff images 27distributors 6Eemail SVI 6FFAQ web support 6faxing SVI 6Frequently Asked Questions see FAQGgeometrical distortion 21Hhistogram 20IIBM 6illumination instability 22internal reflection 22, 23Irix 5Kknowledge Base 7LLeica 24, 25TCS-4D 24TCS-NT 24TCS-SP1 24TCS-SP2 25Leica style numbering 27Mmechanical instability 22Nnon-circular pinhole 23, 24numbering of Tiff series 27Nyquist rate 21OOlympus Fluoview 25opticalunit 26Ppadding 16padding and Wide Field images 17pinholebackprojected 23backprojected pinhole distance 24non-circular 23, 24Rrefractive index mismatch 21rpm 4Ssaturation 10Scientific Volume Imaging B.V. 6shape factor 23Silicon Graphics Inc. 6single plane wide field deconvolution 28SNR 20specimen moves 22spherical aberration 21square pinhole 23, 24stopping criterion 16Tthermal effects 23TIFFseries 27Tiff image deconvolution 27Tiff series numbering 27Tiff slices 8total internal reflection 22Uundersampling 22unstable arc lamps 22Vvibrations 22WWF 3widefield 3Zz-drift 3Zeiss 25LSM310 25LSM410 25LSM510 25z-stage moving 22The Huygens System User’s Guide 29