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DVS_Bericht_393LP

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Figure 4. Powder flow rates (left) and particle temperatures and velocities (right) of different Cu and Sn ratios<br />

The bare dies are placed into the cavities of the substrate carrier and fixed with a laser cut steel mask. The<br />

substrates are preheated to 130 °C. Before the first coating a plasma cleaning with the same plasma parameters<br />

but without particle injection is performed. The coating thickness is adjusted by repeating the process<br />

between one to six times.<br />

Table 2. Fixed and varied parameters of the experimental set-up of Cu-Sn<br />

∑ Samples Cu ratio [%] Sn ratio [%] Fixed parameters<br />

216 (6 samples<br />

per parameter<br />

combination)<br />

100 0<br />

Carrier gas flow rate [l/min] 3<br />

80 20 Primary plasma gas flow rate [l/min] 12<br />

CAPM<br />

60 40 Secondary plasma gas flow rate [l/min] 2<br />

40 60 Preheating [°C] 130<br />

20 80<br />

Temperature [°C] 180<br />

Annealing<br />

0 100 Duration [h] 7<br />

The thermal treatment introduced is performed for half of the samples for each parameter combination. The<br />

holding time is set to 7h at 180 °C under a N2H2 inert atmosphere in the Gero Carbolite GHA 12/300 tube<br />

furnace with a maximum oxygen content of 15 ppm. The trans-liquid phase soldering (diffusion soldering) is<br />

equivalent to the process presented in Ottinger et. Al. [3] and performed under a formic acid containing atmosphere.<br />

The standard soldering profile parameters temperature and pressure are not adjusted during soldering<br />

of different Cu-Sn ratios and for every substrate the same. Six bare dies are soldered onto a direct copper<br />

bonded (DCB) substrate consisting of copper and an insulating ceramic. For microscopical analysis the Scanning<br />

Electron Microscope Tescan Amber X with either an Everhart-Thornley detector (E-T) or LE BSE detector<br />

for highlighted material contrasts at low landing energies was used. The layer thicknesses were analysed via<br />

the laser scanning microscope Keyence VK-X3050. For the optical analysis a Leica DVM6 was used.<br />

20<br />

<strong>DVS</strong> 393

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