Instituto de Ciencia de Materiales de Madrid - Materials Science ...

36. Soft x-ray absorption spectroscopy study of
oxide layers on titanium alloys.
López, M.F.; Soriano, L.; Palomares, F.J.; Sánchez-
Agudo, M.; Fuentes, G.G.; Gutiérrez, A.; Jiménez, J.A.
Surf. Interface Anal. 33, 570-576 (2002).
37. Surface-core-level-shift photoelectron diffraction
of Yb(111) films grown on W(110).
Dávila, M.E., Molodtsov, S.L.; Laubschat, C.; Asensio,
M.C.
Surf. Interface Anal. 33, 595-600 (2002).
38. Experimental photohole lifetimes derived from
two-dimensional states in Ag(111) films deposited
onto H- passivated Si(111)-(1x1) surfaces.
Arranz, A.; Sánchez-Royo, J.F.; Avila, J.; Pérez-Dieste,
V.; Asensio, M.C.
Surf. Rev. Lett. 9, 729-734 (2002).
39. Electronic structure and size of TiO 2 nanoparticles
of controlled size prepared by aerosol
methods.
Soriano, L.; Ahonen, P.P.; Kauppinen, E.I.; Gómez-
García, J.; Morant, C.; Palomares, F.J.; Sánchez-Agudo,
M.; Bressler, P.R.; Sanz, J.M.
Monatsh. Chem. 133, 849-857 (2002).
40. Composition and optical properties of silicon
oxinitrides films deposited by electron cyclotron
resonance.
del Prado, A.; San Andrés, E.; Martínez, F.L.; Martil, I.;
González-Diaz, G.; Bohne, W.; Rohrich, I., Selle, B.;
Fernández, M.
Vacuum 67, 507-512 (2002).
Vila, M.; Martín-Gago, J.A.; Muñoz-Martín, A.; Prieto,
C.; Miranzo, P.; Osendi, M.I.; García-López, J.;
Respaldiza, M.A.
Vacuum 67, 513-518 (2002).
42. Development of a data acquisition and control
system for thin film deposition equipment and its
application to metals-MBE.
Martin, P.P.; Alonso, C.E.; Domingo, I.; Ruiz, A.
Vacuum 64, 373-379 (2002).
43. Different stages during the CVD deposition on
porous substrates.
Alonso,F.; Gómez-Aleixandre,C.; Albella,J.M.; Martí, F.J.
Vacuum 64, 381-386 (2002).
44. Growth and characterisation of boron-carbonnitrogen
coatings obtained by ion beam assisted
evaporation.
Gago, R.; Jiménez, I.; García, I.; Albella, J.M.
Vacuum 64, 199-204 (2002).
45. Photoelectron emission from heterojunctions
with intralayers: band-offset changes vs. band-bending
effects.
Horn, K.; Moreno, M.; Alonso, M.; Höricke, M.; Hey, R.;
Sacedón, J.L.; Ploog, K.H.
Vacuum 67, 115-123 (2002).
46. Physical properties of plasma deposited SiO x
films.
San Andrés, A.; del Prado, E.; Martil, I.; González-Díaz,
G.; Martínez, F.L.; Bravo, D.; López, F.; Fernández, M.
Vacuum 67, 525-529 (2002).
41. Compositional characterization of silicon nitride
thin films prepared by RF-sputtering.
3.1.2
Trabajos en Revistas no incluidas en el
‘Science Citation Index’
Papers in non ‘Science Citation Index’ Journals
1. Aplicaciones optoelectrónicas de estructuras
nanométricas de Silicio.
Martínez-Duart, J.M.; Martín Palma, R.; Guerrero, R.;
Hernández-Vélez, M.; Sánchez-Garrido, O.; Manso
Silván, M.
Rev. Esp. Física 16, 27-33 (2002).
2. Cristales fotónicos: semiconductores de luz.
López, C.
Investigación y Ciencia, Febrero (2002).
3. Directional solidification of the Al 2 O 3 /GdAlO 3
eutectic by laser melting technique.
Andreeta, E.R.M.; Rodrigues, J.A.; Andreeta, M.R.B.;
Agulló-Rueda, F.; Hernandes, A.C.
Cerâmica 48, 29-33 (2002).
4. Nanociencia y Nanotecnología: Aspectos
Generales.
Serena Domingo, P.A.
Encuentros Multidisciplinares, 12-4, 2-14 (2002)
5. On the metallurgical background of amorphousnanocrystalline
transformation.
Lovas, A.; Vázquez, M.
Acta Electrotechnica et Informatica 3, 86-91 (2002).
6. Thiol-functionalized gold surfaces as a strategy to
induce order in membrane-bound enzyme immobilization.
Casero, E.; Darder, M.; Pariente, F.; Lorenzo, E.; Martín-
Benito, J.; Vázquez, L.
Nano Lett. 2, 577-582 (2002).
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