25.02.2013 Views

1993_Motorola_Linear_Interface_ICs_Vol_2.pdf

1993_Motorola_Linear_Interface_ICs_Vol_2.pdf

1993_Motorola_Linear_Interface_ICs_Vol_2.pdf

SHOW MORE
SHOW LESS

Create successful ePaper yourself

Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.

Quality improvement for a task or a process can be quickly<br />

described in terms of the target, current status with respect to<br />

target (variability), reduction of variability (commitment to<br />

never ending improvement), customer requirements (who<br />

receives output, what are a person's requirements/<br />

expectations) and economics (cost of nonconformance, loss<br />

function, etc.).<br />

Application of quality to the whole company has come to be<br />

known by such names as "Total Quality Control" (TQC);<br />

"Company Wide Quality Control" (CWQC); "Total Quality<br />

Excellence" or "Total Quality Engineering" (TQE); "Total<br />

Quality Involvement" (TQI). These names attempt to convey<br />

the idea that quality is a process (a way of acting continuously)<br />

rather than a program (implying a beginning and an end).<br />

Nevertheless for this process to be successful it must be able<br />

to show measurable results.<br />

"Six Sigma is the required capability level to approach the<br />

standard. The standard is zero defects. Our goal is to be<br />

Best-in-Class in product, sales and service." (For a more<br />

detailed explanation, contact your <strong>Motorola</strong> Representative<br />

for a pamphlet of the Six Sigma Challenge.)<br />

Quick insight into six sigma is obtained if we realize that a<br />

six sigma process has variability which is one half of the<br />

variation allowed (tolerance, spread) by the customer<br />

requirements (i.e. natural variation is one half of the customer<br />

specification range for a given characteristic). When six sigma<br />

is achieved, virtually zero defects are observed in the output<br />

of a process/product even allowing for potential process shifts<br />

(Figure 1).<br />

Policies, objectives and five year plans are the mechanisms<br />

for communicating the key beliefs and measurable goals to all<br />

personnel and continuously keeping them in focus. This is<br />

done at the corporate, sector, group, division, and department<br />

levels.<br />

Virtually<br />

Zero Defects<br />

(3.4 ppm)<br />

I<br />

Cp = 2<br />

Cpk=I.5<br />

Quality Concepts<br />

Figure 1. A Six Sigma Process Has Virtually Zero<br />

Defects Allowing for 1.50" Shift<br />

The Analog Division, for example, evaluates performance<br />

to the corporate goals of 10 fold improvement by 1989; 100<br />

fold improvement by 1991 and achievement of six sigma<br />

capability by 1992 by utilizing indices such as Outgoing<br />

Electrical and Visual Mechanical Quality (AOQ) in terms of<br />

PPM (parts per million or sometimes given in parts per billion);<br />

% of devices with zero PPM ; product quality returns<br />

(RMR); number of processes/products with specified capability<br />

indices (cp, cpk); six sigma capability roadmaps;<br />

failure rates for various reliability tests (operating life,<br />

temperature humidity bias, hast, temperature cycling, etc.);<br />

on-time delivery; customer product evaluation and failure<br />

analysis turnaround; cost of nonconformance; productivity<br />

improvement and personnel development.<br />

Figure 2 shows the improvement in electrical outgoing<br />

quality for analog products over recent years in a normalized<br />

form. Figure 3 shows the number of parts with zero PPM over<br />

a period of time.<br />

Documentation control is an important part of statistical<br />

process control. Process mapping (flow charting etc. ) with<br />

documentation identified allows visualization and therefore<br />

optimization of the process. Figure 4 shows a portion of a flow<br />

chartforwaferfabrication. Control plans are an important part<br />

of Statistical Process Control, these plans identify in detail<br />

critical points where data for process control is taken,<br />

parameters measured, frequency of measurements, type of<br />

control device used, measuring equipment, responsibilities<br />

and reaction plans. Figure 5 shows a portion of a control plan<br />

for wafer fabrication. Six sigma progress is tracked by<br />

roadmaps based on the six sigma process, a portion of which<br />

is shown on Figure 6.<br />

On-time delivery is of great importance, with the current<br />

emphasis on just-in-time systems. Tracking is done on an<br />

overall basis, and at the device levels.<br />

Six Sigma Capability<br />

Cp = 2<br />

Cpk = 1.5<br />

-60" -50" -40" -30" -20" -10 0" 10" 20 30" 40"<br />

± Six Sigma Design Specification Width<br />

MOTOROLA LINEAR/INTERFACE <strong>ICs</strong> DEVICE DATA<br />

14-2<br />

50" 60"

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!