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Bias Circuit

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B.1 Fundamentals of Bipolar Junction Transistor Action<br />

A bipolar junction transistor is made up of a sandwich of two semiconductor pn junctions.<br />

Transistors are either npn or pnp. In the active-mode transistor state, one junction, the input<br />

junction, is forward biased, and the opposite junction, the output junction, is reverse biased.<br />

The behavior of the individual pn junction diode will first be considered to clarify forward and<br />

reverse bias.<br />

A semiconductor pn-junction diode in diagrammatic form is shown in Fig. B.1. The current and<br />

voltage of an ideal pn-junction diode are related by<br />

Equation B.1<br />

Figure B.1. Diagrammatic pn-junction diode. Applied voltage VD is<br />

shown for forward bias for which current freely flows. Opposite<br />

polarity is reverse bias, where the diode is essentially cut off and ID =<br />

–IS.<br />

where VD is the voltage applied between the p and n regions (positive at the p terminal), ID is<br />

the responding current, and ISd is the saturation current. The thermal voltage, VT, is defined as<br />

VT = kT/q, where T is the temperature, k is the Boltzmann constant and q is the electron<br />

charge. At 27°C, VT 26 mV. VD is positive for forward bias and negative for reverse bias.<br />

As illustrated by the arrows in the junction of Fig. B.1, for forward bias, the diode current<br />

consists of injection of holes from the p region (positive free carriers) into the n region and<br />

injection of electrons from the n region (negative free carriers) into the p region. The<br />

exponential factor in (B.1) is associated with the statistics of the free carriers, holes and<br />

electrons, and the effect on the lowering of the barrier to free-carrier flow of the application of<br />

the positive applied voltage.<br />

The magnitude of ISd is dependent on semiconductor electronic properties such as doping<br />

levels and free-carrier lifetime and mobility. The magnitude of current flow for a given VD is<br />

dictated by a combination of the barrier-lowering factor (in the exponential) and the rate of<br />

free-carrier recombination; that is, carriers are annihilated by recombining with the opposite<br />

type of carrier on the opposite side of the junction from which they are injected.<br />

A typical value for saturation current, ISd, is 10 –11 mA, such that, for example, for VD = 0.6 V,<br />

ID 0.1 mA and increases by an order of magnitude for each additional increment of δVD 60<br />

mV (at room temperature). The equation would suggest that for negative VD and |VD| >> VT,<br />

ID = –ISd and therefore is very small compared to the current under forward bias. In real pn-

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