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PROCEEDINGS OF THE 7 INTERNATIONAL ... - Fizika

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Scatter dose ( Gy /mA s)<br />

1.55E-12<br />

1.45E-12<br />

1.35E-12<br />

1.25E-12<br />

1.15E-12<br />

1.05E-12<br />

9.50E-13<br />

8.50E-13<br />

I. Cibulskaite et al. / Medical Physics in the Baltic States 7 (2009) 72 - 75<br />

y = 2E-14x + 8E-13<br />

y = 2E-14x + 3E-13<br />

0.1 mm Si<br />

0.5 mm<br />

Si<br />

7.50E-13<br />

y = 2E-14x + 2E-13<br />

6.50E-13<br />

1.5 mm<br />

5.50E-13<br />

y = 2E-14x + 2E-14<br />

4.50E-13<br />

3.50E-13<br />

y = 2E-14x - 1E-14<br />

24 25 26 27 28 29 30 31 32 33<br />

X-ray tube voltage (kV)<br />

Si without<br />

coating 1 mm mylar<br />

coating<br />

200 nm DLC coating<br />

1 mm rubber<br />

coating<br />

1 mm DLC<br />

coating<br />

1 mm polyethylene<br />

coating<br />

Fig. 1. Simulated scatter doses in Si samples of different<br />

thickness coated by different coatings of the same thickness.<br />

Detector thicknesses are indicated.<br />

Three possible cases were investigated for the<br />

estimation of the influence of the coating thickness on<br />

the X-ray attenuation processes in irradiated detector<br />

constructions: 1) coating thickness h is of the same<br />

order as the thickness of the active layer d (h ≈ d); 2)<br />

h/d ≤ 0.1; and 3) h

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