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PDF file - Facultatea de Chimie şi Inginerie Chimică

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EXPERIMENTAL SECTION<br />

210<br />

MARIA ŞTEFAN, IOAN BÂLDEA, RODICA GRECU ET ALL<br />

ZnCdS thin films have been grown on 3 x 4.5 x 1 cm 3 optical glass<br />

substrates by CBD using the multilayer technique already employed. The<br />

<strong>de</strong>position of ZnCdS thin films was carried out using the method employed for<br />

the chemical bath <strong>de</strong>position of ZnS and CdS, respectively. The starting point<br />

was the chemical bath used for ZnS film <strong>de</strong>position, as follows: [zinc acetate] =<br />

0.015 M; [sodium citrate] = 0.045 M; [ammonia] = 0.3 M; [thiourea] = 0.15 M.<br />

ZnCdS thin films were <strong>de</strong>posited from chemical bath obtained by replacing<br />

5 ÷100 mol % of the zinc acetate from the standard chemical bath with cadmium<br />

acetate. The glass substrates have been previously ultrasonically cleaned in<br />

acetone-ethanol mixture. During the <strong>de</strong>position, the bath temperature was<br />

maintained at 82-86°C and the solution pH at 9.5-10.5. Luminescent ZnCdS<br />

thin films were prepared using indirect doping technique. In this purpose,<br />

ZnCdS /glass/ ZnCdS heterostructures were introduced into a Cu-containing<br />

doping mixture based on high-purity ZnS pow<strong>de</strong>r and annealed at 550°C. The<br />

<strong>de</strong>tails of the experimental technique and conditions have been <strong>de</strong>scribed in<br />

our previous works [16, 18-20]<br />

Chemical bath <strong>de</strong>posited ZnCdS /glass/ ZnCdS structures have<br />

been analysed as grown or after annealing. Packing <strong>de</strong>nsity was <strong>de</strong>termined<br />

by the micro-weighing method. An UNICAM Spectrometer UV4 has been used<br />

for optical investigations of ZnCdS thin films and a Perkin Elmer 204<br />

Fluorescence Spectrophotometer was used to investigate photoluminescence<br />

characteristics. The structural properties of the films were studied with a standard<br />

DRON-3M Diffractometer using the filtered Kα emission of molyb<strong>de</strong>num<br />

(λ=0.70932 Å). Morphology of the films was studied with a JEOL-JSM 5510LV<br />

Electron Microscop. Chemical composition of the films was <strong>de</strong>tected by Energy<br />

Dispersive X-ray Analysis (EDX) in a JSM 5510LV Scanning Electron Microscop<br />

atached with an Oxford Instruments, Inca 200 analytical system.<br />

ACKNOWLEDGEMENTS<br />

The work was financially supported by the Romanian Ministry of<br />

Education and Research MEC-CNCSIS Grant Td 8/52- 2007.<br />

REFERENCES<br />

1. I. O. Ola<strong>de</strong>ji, L. Chow, Thin Solid Films, 1999, 399, 148.<br />

2. T. B. Nasr, N. Kamoun, M. Kanzari, R. Benaceur, Thin Solid Films, 2006, 500, 4.<br />

3. J. Lee, Applied Surface Science, 2005, 252, 1398.<br />

4. K. Sambhu, C. O. Larry, Thin Solid Films, 2005, 471, 298.

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