azu_td_1349475_sip1_... - Arizona Campus Repository
azu_td_1349475_sip1_... - Arizona Campus Repository
azu_td_1349475_sip1_... - Arizona Campus Repository
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41<br />
A m = e-^sinci^j^t<br />
ij = 0<br />
3.17<br />
and the diffraction efficiency of the m th order is defined as<br />
T]=A mA m 3.18<br />
Solving Equation 3.18, the diffraction efficiency of the m th order of an N phase<br />
level element becomes,<br />
Vm = sin(jjm-0))<br />
i* 1 )<br />
sin^m-ipo))<br />
2<br />
3.19<br />
The primary focus of the diffractive lens occurs in the first order and is the case<br />
of interest. For m=1, ^0=1, Equation 3.19 reduces to the familiar expression<br />
T|=sinc 2 (l/N) 320<br />
Figure 3-9 is a histogram of "H as a function of N which shows that as N<br />
increases, the diffraction efficiency of multilevel element approaches 100%.<br />
3.5 Fabrication<br />
The zone boundaries for the desired N level diffractive lens are<br />
calculated for M masks using Equation 3.9. This data is then converted into a<br />
format that can be read by an electron beam writing machine. The electron<br />
beam writer approximates the circular zones of the diffractive lens by using<br />
chains of multi-sided polygons" 2 and creates a set of binary amplitude masks