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azu_td_1349475_sip1_... - Arizona Campus Repository

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55<br />

modulation is calculated using Equation 3.22,<br />

du = —^—<br />

2>-l). 4-1<br />

In this case, M equals one since only one mask is necessary to produce a<br />

binary lens. The index of refraction of Shipley 1811 photoresist at 670 nm is<br />

approximately equal to 1.64* Thus the necessary photoresist thickness is 0.52<br />

|im for a wavelength of 670 nm and a thickness of 0.61 |im for a wavelength of<br />

780 nm. The photoresist thickness was tailored to be close to these thickness<br />

values using the spinning parameters discussed in section 4.4.<br />

A portion of one of the resulting lens arrays produced is shown in Figure<br />

4-4. The ring structure of the binary photoresist lenses from this 4x4 array is<br />

clearly evident. Each lens in the array has 500 nm diameter, 59 zones, and a f-<br />

number of 3.5. More detailed information on the lens structure obtained from a<br />

scanning electron microscope is provided in Figure 4-5. The optical<br />

performance of these binary lenses will be discussed in chapter five.

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