azu_td_1349475_sip1_... - Arizona Campus Repository
azu_td_1349475_sip1_... - Arizona Campus Repository
azu_td_1349475_sip1_... - Arizona Campus Repository
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55<br />
modulation is calculated using Equation 3.22,<br />
du = —^—<br />
2>-l). 4-1<br />
In this case, M equals one since only one mask is necessary to produce a<br />
binary lens. The index of refraction of Shipley 1811 photoresist at 670 nm is<br />
approximately equal to 1.64* Thus the necessary photoresist thickness is 0.52<br />
|im for a wavelength of 670 nm and a thickness of 0.61 |im for a wavelength of<br />
780 nm. The photoresist thickness was tailored to be close to these thickness<br />
values using the spinning parameters discussed in section 4.4.<br />
A portion of one of the resulting lens arrays produced is shown in Figure<br />
4-4. The ring structure of the binary photoresist lenses from this 4x4 array is<br />
clearly evident. Each lens in the array has 500 nm diameter, 59 zones, and a f-<br />
number of 3.5. More detailed information on the lens structure obtained from a<br />
scanning electron microscope is provided in Figure 4-5. The optical<br />
performance of these binary lenses will be discussed in chapter five.