EMC32 / AMS32 V8.52 Release Note - Rohde & Schwarz

OTA Section (AMS32)
16 OTA Section (AMS32)
16.1 New Option AMS32-K30 (TIS Tests on LTE-FDD Mobile
Terminals According to VzW Test Plan)
The new extension module AMS32-K30 implements OTA Sensitivity tests on LTE-FDD
Mobile Terminals according to Verizon Wireless (VzW) Compliance test plan LTE Overthe-Air
Radiated Performance (version 6.0 September 2010).
While TRP (Radiated Power) tests according to the mentioned test plan proceed according
to the general principles for such tests, and can be performed without the new options, TIS
(Sensitivity) tests require a number of singular procedures that are activated by this new
version.
The test method is activated by selecting a new Measurement Quantity Complex RSSI in
the Measurement Settings section of the OTA Test Template Editor. Some additional
entries have been implemented in this section which can be used for parametrizing the test
run.
3D pattern acquisition is walked through controlling the positioning system only, but without
querying any measurement values. At the end, the user is asked by a dialog window to
extract the complex RSSI values logged by the DUT to a file formatted according to the
specifications of the standard, and to import this file into AMS32. The software then maps
the logged values to the positions set for pattern acquisition, based on the time-stamp
information. Copies of the imported file and of the internal time-base reference are saved to
the test.
Rohde & Schwarz 17