FY2010 - Oak Ridge National Laboratory
FY2010 - Oak Ridge National Laboratory
FY2010 - Oak Ridge National Laboratory
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<strong>Laboratory</strong>-Wide Fellowships—<br />
Weinberg Fellowship<br />
future materials with improved photovoltaic efficiency. Complementary electron microscopy and atom<br />
probe techniques were explored to characterize the structures in CdTe thin films and other energy-related<br />
materials in order to provide a more fundamental understanding of the doping effects and multidopant<br />
synergies at interfaces in CdTe absorber layers. By improving the basic understanding of how to<br />
characterize CdTe layers, future lower-cost, higher-efficiency solar cells can be enabled.<br />
Mission Relevance<br />
Solar energy is a domestic, non-carbon renewable energy source, and the development of low-cost, highefficiency<br />
PV technologies will have a large impact on U.S. manufacturing. Improved efficiencies of PV<br />
cells and component absorber layers have relevance to the DOE Energy Efficiency and Renewable<br />
Energy (EERE) mission and improved manufacturability to the DOE Industrial Technologies mission.<br />
The primary thrust of this project is to develop a deeper understanding of defect behavior in compound<br />
semiconductor PV thin films, which is relevant to the Basic Energy Sciences (BES) Materials Science and<br />
Engineering (MSE) mission. The most immediate impact of this project was the development of<br />
experimental characterization techniques, relevant to both CdTe PVs and energy-related materials in<br />
general, and these techniques have been made available through the SHaRE BES-Scientific User<br />
Facilities Division (SUFD) program.<br />
Results and Accomplishments<br />
Studies on CdTe thin films allowed the proper experimental methodologies to be developed, yielding<br />
valuable information to enable future studies to produce science-based understandings of solar PV<br />
systems. First, CdTe is found to be highly sensitive to damage from electron or ion beams; therefore,<br />
focused ion beam (FIB) sample preparation methodologies were refined to allow preparation of beamsensitive<br />
material on a highly insulating substrate and to prepare site-specific specimens for electron<br />
backscatter diffraction. Second, transmission electron microscopy (TEM) techniques were refined to<br />
allow high-resolution elemental mapping via X-ray spectrum imaging and energy-filtered TEM with<br />
minimal perturbation of the sample structure due to fast electron damage. These techniques were then<br />
applied to the CdTe/CdS active interface in PV device structures, where S-Te interdiffusion was<br />
characterized for relation to device performance. Te-S interdiffusion was found to be less than 10 nm, and<br />
small defective areas at the CdS/CdTe and CdS/substrate boundaries were found by MVSA despite being<br />
missed by standard analysis techniques.<br />
In addition to experimental methodology refinements, mathematical techniques were developed.<br />
Experiments such as the X-ray spectrum imaging applied to the CdTe/CdS interface produce prodigious<br />
quantities of data, and unbiased statistically derived methods are needed to draw proper materials science<br />
and engineering conclusions from such experimental data. Mathematical methods and computer codes<br />
were developed to (1) use multivariate statistical analysis to produce an unbiased, low-noise description<br />
of atom probe tomography reconstructions and (2) resolve the contributions of embedded particles from<br />
the surrounding matrix in TEM X-ray spectrum imaging of thin samples using multivariate curve<br />
resolution mathematical techniques. These mathematical methods were tested by application to a diverse<br />
variety of different energy materials.<br />
Information Shared<br />
Miller, M. K., C. M. Parish, and C. Capdevila. 2010. “A MVSA Approach to Mine Information from<br />
APT Data.” International Field Emission Symposium 2010.<br />
Parish, C. M. 2010. “Multivariate Curve Resolution to Determine Fully-Embedded-Particle Compositions<br />
in STEM-EDS Spectrum Images.” Microscopy and Microanalysis 2010 Conference Proceedings<br />
16(Suppl. 2), 276–277.<br />
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