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FY2010 - Oak Ridge National Laboratory

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<strong>Laboratory</strong>-Wide Fellowships—<br />

Weinberg Fellowship<br />

future materials with improved photovoltaic efficiency. Complementary electron microscopy and atom<br />

probe techniques were explored to characterize the structures in CdTe thin films and other energy-related<br />

materials in order to provide a more fundamental understanding of the doping effects and multidopant<br />

synergies at interfaces in CdTe absorber layers. By improving the basic understanding of how to<br />

characterize CdTe layers, future lower-cost, higher-efficiency solar cells can be enabled.<br />

Mission Relevance<br />

Solar energy is a domestic, non-carbon renewable energy source, and the development of low-cost, highefficiency<br />

PV technologies will have a large impact on U.S. manufacturing. Improved efficiencies of PV<br />

cells and component absorber layers have relevance to the DOE Energy Efficiency and Renewable<br />

Energy (EERE) mission and improved manufacturability to the DOE Industrial Technologies mission.<br />

The primary thrust of this project is to develop a deeper understanding of defect behavior in compound<br />

semiconductor PV thin films, which is relevant to the Basic Energy Sciences (BES) Materials Science and<br />

Engineering (MSE) mission. The most immediate impact of this project was the development of<br />

experimental characterization techniques, relevant to both CdTe PVs and energy-related materials in<br />

general, and these techniques have been made available through the SHaRE BES-Scientific User<br />

Facilities Division (SUFD) program.<br />

Results and Accomplishments<br />

Studies on CdTe thin films allowed the proper experimental methodologies to be developed, yielding<br />

valuable information to enable future studies to produce science-based understandings of solar PV<br />

systems. First, CdTe is found to be highly sensitive to damage from electron or ion beams; therefore,<br />

focused ion beam (FIB) sample preparation methodologies were refined to allow preparation of beamsensitive<br />

material on a highly insulating substrate and to prepare site-specific specimens for electron<br />

backscatter diffraction. Second, transmission electron microscopy (TEM) techniques were refined to<br />

allow high-resolution elemental mapping via X-ray spectrum imaging and energy-filtered TEM with<br />

minimal perturbation of the sample structure due to fast electron damage. These techniques were then<br />

applied to the CdTe/CdS active interface in PV device structures, where S-Te interdiffusion was<br />

characterized for relation to device performance. Te-S interdiffusion was found to be less than 10 nm, and<br />

small defective areas at the CdS/CdTe and CdS/substrate boundaries were found by MVSA despite being<br />

missed by standard analysis techniques.<br />

In addition to experimental methodology refinements, mathematical techniques were developed.<br />

Experiments such as the X-ray spectrum imaging applied to the CdTe/CdS interface produce prodigious<br />

quantities of data, and unbiased statistically derived methods are needed to draw proper materials science<br />

and engineering conclusions from such experimental data. Mathematical methods and computer codes<br />

were developed to (1) use multivariate statistical analysis to produce an unbiased, low-noise description<br />

of atom probe tomography reconstructions and (2) resolve the contributions of embedded particles from<br />

the surrounding matrix in TEM X-ray spectrum imaging of thin samples using multivariate curve<br />

resolution mathematical techniques. These mathematical methods were tested by application to a diverse<br />

variety of different energy materials.<br />

Information Shared<br />

Miller, M. K., C. M. Parish, and C. Capdevila. 2010. “A MVSA Approach to Mine Information from<br />

APT Data.” International Field Emission Symposium 2010.<br />

Parish, C. M. 2010. “Multivariate Curve Resolution to Determine Fully-Embedded-Particle Compositions<br />

in STEM-EDS Spectrum Images.” Microscopy and Microanalysis 2010 Conference Proceedings<br />

16(Suppl. 2), 276–277.<br />

265

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