ESD - BiTS Workshop
ESD - BiTS Workshop
ESD - BiTS Workshop
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Characterization<br />
• Resistance vs carbon content<br />
• Resistance fluctuation<br />
• Resistance change against applied voltage<br />
• Resistance of inner layer<br />
• Static decay time vs resistance<br />
• Residual peak voltage vs resistance<br />
• Peak current analysis on <strong>ESD</strong><br />
• Leak current analysis of a socket<br />
• Other properties<br />
11/12/2002<br />
<strong>BiTS</strong> 2005<br />
10
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