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Burn-in & Test Socket Workshop TM COPYRIGHT NOTICE • The papers in this publication comprise the proceedings of the 2005 BiTS Workshop. They reflect the authors’ opinions and are reproduced as presented , without change. Their inclusion in this publication does not constitute an endorsement by the BiTS Workshop, the sponsors, BiTS Workshop LLC, or the authors. • There is NO copyright protection claimed by this publication or the authors. However, each presentation is the work of the authors and their respective companies: as such, it is strongly suggested that any use reflect proper acknowledgement to the appropriate source. Any questions regarding the use of any materials presented should be directed to the author/s or their companies. • The BiTS logo and ‘Burn-in & Test Socket Workshop’ are trademarks of BiTS Workshop LLC.
tm Burn-in & Test Socket Workshop Hot Topics Session Tuesday 3/08/05 3:30PM CONTROLLING ESD Technical Program “Methods Of Preventing ESD In Module Testing” Zen Podpora – IBM Microelectronics Qifang (Michelle) Qiao – IBM Microelectronics Patrick Rafter – IBM Microelectronics “New ESD Control Polymers” Naomitsu Nishihata – Kureha Chemical Industry Co., Ltd.
Page 1: Burn-in & Test Socket Workshop Marc
Page 5 and 6: Objectives • ESD overview • Imp
Page 7 and 8: What is Static Electricity? • Sim
Page 9 and 10: Static Charge Buildup • Only insu
Page 11 and 12: Electrostatic Discharge [ESD] • C
Page 13 and 14: Impact of ESD • Electrostatic Dis
Page 15 and 16: Problems with Conventional ESD Prev
Page 17 and 18: IBM ESD Socket • Alignment plate
Page 19 and 20: Reference Materials • Basics of S
Page 21 and 22: Agenda • What is ESD • Material
Page 23 and 24: What is ESD •Human Body Model: Di
Page 25 and 26: Technology review of materials Conv
Page 27 and 28: New Technology • Combine a specia
Page 29 and 30: Characterization • Resistance vs
Page 31 and 32: Resistivity Fluctuation Diameter of
Page 33 and 34: Resistivity vs Voltage 1.E+15 Surfa
Page 35 and 36: Static decay time 1000V electric so
Page 37 and 38: Hot spot voltage test + Surface ele
Page 39 and 40: Peak current analysis Oscilloscope
Page 41 and 42: Leak current analysis pA Hi Resista
Page 43 and 44: Other properties Properties Units E
Page 45: Conclusion • The ESD control mate

ESD - BiTS Workshop

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