Homer Hot Measurement and Tuning System - S-TEAM Lab
Homer Hot Measurement and Tuning System - S-TEAM Lab
Homer Hot Measurement and Tuning System - S-TEAM Lab
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These features make <strong>Homer</strong> suitable for effective <strong>and</strong> easy monitoring <strong>and</strong> controlling process parameters, e.g. in<br />
plasma generation, semiconductor fabrication, heating, drying, sintering, coating, chemical reactions, materials<br />
processing <strong>and</strong> many other industrial applications.<br />
<strong>Homer</strong>, in particular:<br />
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Enables to underst<strong>and</strong> the complex impedance (vector reflection coefficient) of microwave loads<br />
Provides means for performance tests during the development <strong>and</strong> production of microwave applicators<br />
Can be used to characterize new equipment designs<br />
Allows designing, adjusting, or programming equipment to desired characteristics<br />
Maintains design specifications during manufacturing<br />
Gives on-line control of microwave processes<br />
HomSoft Windows Visualization <strong>and</strong> Control Software<br />
Visualization of measured complex reflection coefficient in various formats, including<br />
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- Magnitude<br />
- Phase angle<br />
- Return loss<br />
- VSWR<br />
- Polar display<br />
- Smith charts (impedance <strong>and</strong> admittance)<br />
- Rieke-type chart<br />
In case of Autotuner, the display can be switched between<br />
- Input reflection coefficient (includes effect of inserted tuning stubs)<br />
- Load (deembedded) reflection coefficient, i.e. reflection coefficient that would be measured if the tuning<br />
stubs were withdrawn<br />
You can see both of them simultaneously in two separate windows.<br />
<strong>Measurement</strong> of incident, reflected <strong>and</strong> absorbed powers <strong>and</strong> their displaying in various formats, including<br />
watts, decibels, percentage of incident power<br />
Numerical readout of signal frequency, reflection coefficient <strong>and</strong> powers in various formats<br />
Displaying the time evolution of measured quantities<br />
Displaying the waveform (envelope) of microwave power in Rectified <strong>and</strong> Pulsed operation modes<br />
Arbitrary shifting of the load reference plane<br />
Saving measured data as tables (text files) or pictures (BMP, GIF, <strong>and</strong> JPG)<br />
Periodic data logging of all or some of the measured quantities<br />
Multiple windows enable to observe the same results in different formats simultaneously<br />
Wide selection of appearance of displayed curves<br />
Storing <strong>and</strong> retrieving of complete system settings adapted to particular tasks<br />
Inside <strong>Homer</strong><br />
A block diagram of a generic <strong>Homer</strong> Autotuner is shown in Figure 1. The <strong>Homer</strong> Analyzer part system is based on<br />
the six-port reflectometer (SPR) principle. SPR is suitable for high-power industrial applications due to its capability<br />
of precision on-line measurement of<br />
- complex (vector) reflection coefficient of microwave applicators<br />
- incident, reflected <strong>and</strong> absorbed powers<br />
User's H<strong>and</strong>book <strong>Homer</strong> <strong>Hot</strong> <strong>Measurement</strong> <strong>and</strong> <strong>Tuning</strong> <strong>System</strong> Introduction 3
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