Advanced Calibration Techniques for VNAs

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Component Measurement ChallengesNon-insertable coaxial devices– Same sex connectors (e.g., SMA females)– Mixed connectors (e.g., SMA and Type-N)Devices without coaxial connectors– Surface-mount devices– Devices on wafer– Devices with waveguide portsMechanically difficult situations– Physically long devices– Fixed test-port positions– Non-in-line connectorsMultiport (>4 port) devicesAdvanced VNA Calibration© Agilent Technologies, Inc. 2006 Page M6- 10
Unknown Thru CalibrationThe “Unknown Thru” technique is…• Used when a “flush” (zero-length or mate-able) thru cannot be usedor when using a flush thru would cause measurement impairment• A refinement of SOLT calibration• Also called short-open-load-reciprocal-thru (SOLR)Unknown Thru technique eliminates need for…• Matched or characterized thru adapters• Moving or bending test cablesWorks great for many component measurement challenges…• Non-insertable devices• Mechanically difficult situations• Multiport devicesAdvanced VNA Calibration© Agilent Technologies, Inc. 2006 Page M6- 11
Page 1 and 2: Advanced Calibration Techniquesfor
Page 3 and 4: Agenda• Overview of Calibration
Page 5 and 6: The Need for CalibrationHow do we g
Page 7 and 8: Systematic Measurement ErrorsRrecei
Page 9: Performing the Calibration: TRL•
Page 13 and 14: Compromises of Traditional Non-Inse
Page 15 and 16: Unknown Thru AlgorithmUnknown thru
Page 17 and 18: Two-Port Unknown Thru Calibration S
Page 19 and 20: Unknown Thru Example Using Attenuat
Page 21 and 22: dBCable Movement ErrorCable Movemen
Page 23 and 24: Magnitude (dB)Comparing Unknown and
Page 25 and 26: Measuring Devices with Non-Aligned
Page 27 and 28: 4-Port Unknown Thru with Different
Page 29 and 30: Unknown Thru for Different Waveguid
Page 31 and 32: Traditional Polynomial-Based Models
Page 33 and 34: Calibration Standard Modeling Proce
Page 35 and 36: Benefits of Data-Based Standards•
Page 37 and 38: Data-Based Standard FileCITIFILE A.
Page 39 and 40: Advantage of Measuring More Than 3
Page 41 and 42: Factors That Contribute to Weightin
Page 43 and 44: F lush S hor t d BF lush S hor t P
Page 45 and 46: A irline S hor t d BD eviation f ro
Page 47 and 48: Offset Load Calibration Advantages
Page 49 and 50: DirectMeasurementModelingError Corr
Page 51 and 52: Automatic Port Extensions - Step 1
Page 53 and 54: Measurement ResultsDelay and loss c
Page 55 and 56: Which Standards Should I Use?• Fo
Page 57 and 58: Narrowband APE ExampleAPE with shor
Page 59 and 60: Summary of Automatic Port Extension
Page 61 and 62:
Order of Fixturing Operations• Fi
Page 63 and 64:
Differential Port MatchingAdvanced
Page 65 and 66:
Two-Port De-Embedding.s2p file1 2Fi
Page 67 and 68:
Two Versus Four Port Embedding /De-
Page 69 and 70:
How Do I Get My Probe De-Embedding
Page 71 and 72:
Measuring Probes Using Adapter-Remo
Page 73 and 74:
Measuring Probes Using Unknown Thru
Page 75 and 76:
What is Electronic Calibration?•
Page 77 and 78:
Agilent’s “ECal” Line of Elec
Page 79 and 80:
User Characterization: Using Adapte
Page 81 and 82:
User Characterization: Applying Fix
Page 83 and 84:
Summary (continued)• Two-tier TRL
Page 85 and 86:
Additional Resources• Application
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Advanced Calibration Techniques for VNAs

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