Advanced Calibration Techniques for VNAs

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Virtual Fixturing Using Software Tools in VNA• Software-fixture tools recalculate single-ended S-parameter data to…– Change test port impedances– De-embed test fixtures, probes, adapters, cables, etc.– Embed matching circuits– Calculate mixed-mode (differential / common mode) S-parameters• Fixturing features are common to PNAand ENA families and Physical LayerTest Software (PLTS)• Especially useful for single-endedto-balancedor fully balanced devicesAdvanced VNA Calibration© Agilent Technologies, Inc. 2006 Page M6- 60
Order of Fixturing Operations• First, single-ended functionsare processed in this order:– Port extensions– 2-port de-embedding– Port Z (impedance) conversion– Port matching / circuit embedding– 4-port network embed/de-embed• Then, balanced functions areExample circuit simulationprocessed in this order:– Balanced conversion– Differential- / common-mode port Z conversion– Differential matching / circuit embeddingAdvanced VNA Calibration© Agilent Technologies, Inc. 2006 Page M6- 61
Page 1 and 2:
Advanced Calibration Techniquesfor
Page 3 and 4:
Agenda• Overview of Calibration
Page 5 and 6:
The Need for CalibrationHow do we g
Page 7 and 8:
Systematic Measurement ErrorsRrecei
Page 9 and 10: Performing the Calibration: TRL•
Page 11 and 12: Unknown Thru CalibrationThe “Unkn
Page 13 and 14: Compromises of Traditional Non-Inse
Page 15 and 16: Unknown Thru AlgorithmUnknown thru
Page 17 and 18: Two-Port Unknown Thru Calibration S
Page 19 and 20: Unknown Thru Example Using Attenuat
Page 21 and 22: dBCable Movement ErrorCable Movemen
Page 23 and 24: Magnitude (dB)Comparing Unknown and
Page 25 and 26: Measuring Devices with Non-Aligned
Page 27 and 28: 4-Port Unknown Thru with Different
Page 29 and 30: Unknown Thru for Different Waveguid
Page 31 and 32: Traditional Polynomial-Based Models
Page 33 and 34: Calibration Standard Modeling Proce
Page 35 and 36: Benefits of Data-Based Standards•
Page 37 and 38: Data-Based Standard FileCITIFILE A.
Page 39 and 40: Advantage of Measuring More Than 3
Page 41 and 42: Factors That Contribute to Weightin
Page 43 and 44: F lush S hor t d BF lush S hor t P
Page 45 and 46: A irline S hor t d BD eviation f ro
Page 47 and 48: Offset Load Calibration Advantages
Page 49 and 50: DirectMeasurementModelingError Corr
Page 51 and 52: Automatic Port Extensions - Step 1
Page 53 and 54: Measurement ResultsDelay and loss c
Page 55 and 56: Which Standards Should I Use?• Fo
Page 57 and 58: Narrowband APE ExampleAPE with shor
Page 59: Summary of Automatic Port Extension
Page 63 and 64: Differential Port MatchingAdvanced
Page 65 and 66: Two-Port De-Embedding.s2p file1 2Fi
Page 67 and 68: Two Versus Four Port Embedding /De-
Page 69 and 70: How Do I Get My Probe De-Embedding
Page 71 and 72: Measuring Probes Using Adapter-Remo
Page 73 and 74: Measuring Probes Using Unknown Thru
Page 75 and 76: What is Electronic Calibration?•
Page 77 and 78: Agilent’s “ECal” Line of Elec
Page 79 and 80: User Characterization: Using Adapte
Page 81 and 82: User Characterization: Applying Fix
Page 83 and 84: Summary (continued)• Two-tier TRL
Page 85 and 86: Additional Resources• Application
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Advanced Calibration Techniques for VNAs

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