Advanced Calibration Techniques for VNAs

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Automatic Port Extensions – Implementation• Measures S ii (reflection) of each port• Uses ideal open or short models• Computes electrical delay using best-fit straight-line model• Computes insertion loss using a best-fit coaxial (onefrequency point) or dielectric (two frequency points) loss model• Computed delay and loss values are automatically displayed via a portextensiontool bar• Values saved as part ofinstrument stateMeasure reflectionof each test portwith open or shortAdvanced VNA Calibration© Agilent Technologies, Inc. 2006 Page M6- 54
Which Standards Should I Use?• For broadband applications, shorts or opens work equally well• Choose the most convenient standard (often an open) –this is a key benefit of Automatic Port Extensions• Will using both an open and a short improve accuracy?– Using two standards makes little difference for broadbandmeasurements, as many ripples occur and calculated loss is the samefor open or short– Using two standards improves accuracyfor narrowband measurements, where afull ripple cycle does not occurshortCalculated loss is basicallysame for open or shortopenBroadbandAdvanced VNA Calibration© Agilent Technologies, Inc. 2006 Page M6- 55
Page 1 and 2:
Advanced Calibration Techniquesfor
Page 3 and 4: Agenda• Overview of Calibration
Page 5 and 6: The Need for CalibrationHow do we g
Page 7 and 8: Systematic Measurement ErrorsRrecei
Page 9 and 10: Performing the Calibration: TRL•
Page 11 and 12: Unknown Thru CalibrationThe “Unkn
Page 13 and 14: Compromises of Traditional Non-Inse
Page 15 and 16: Unknown Thru AlgorithmUnknown thru
Page 17 and 18: Two-Port Unknown Thru Calibration S
Page 19 and 20: Unknown Thru Example Using Attenuat
Page 21 and 22: dBCable Movement ErrorCable Movemen
Page 23 and 24: Magnitude (dB)Comparing Unknown and
Page 25 and 26: Measuring Devices with Non-Aligned
Page 27 and 28: 4-Port Unknown Thru with Different
Page 29 and 30: Unknown Thru for Different Waveguid
Page 31 and 32: Traditional Polynomial-Based Models
Page 33 and 34: Calibration Standard Modeling Proce
Page 35 and 36: Benefits of Data-Based Standards•
Page 37 and 38: Data-Based Standard FileCITIFILE A.
Page 39 and 40: Advantage of Measuring More Than 3
Page 41 and 42: Factors That Contribute to Weightin
Page 43 and 44: F lush S hor t d BF lush S hor t P
Page 45 and 46: A irline S hor t d BD eviation f ro
Page 47 and 48: Offset Load Calibration Advantages
Page 49 and 50: DirectMeasurementModelingError Corr
Page 51 and 52: Automatic Port Extensions - Step 1
Page 53: Measurement ResultsDelay and loss c
Page 57 and 58: Narrowband APE ExampleAPE with shor
Page 59 and 60: Summary of Automatic Port Extension
Page 61 and 62: Order of Fixturing Operations• Fi
Page 63 and 64: Differential Port MatchingAdvanced
Page 65 and 66: Two-Port De-Embedding.s2p file1 2Fi
Page 67 and 68: Two Versus Four Port Embedding /De-
Page 69 and 70: How Do I Get My Probe De-Embedding
Page 71 and 72: Measuring Probes Using Adapter-Remo
Page 73 and 74: Measuring Probes Using Unknown Thru
Page 75 and 76: What is Electronic Calibration?•
Page 77 and 78: Agilent’s “ECal” Line of Elec
Page 79 and 80: User Characterization: Using Adapte
Page 81 and 82: User Characterization: Applying Fix
Page 83 and 84: Summary (continued)• Two-tier TRL
Page 85 and 86: Additional Resources• Application
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Advanced Calibration Techniques for VNAs

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