Advanced Calibration Techniques for VNAs

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On-Wafer Mixer Measurements Using FCA• Previous versions of the Frequency Converter Application (FCA) did notallow on-wafer measurements using Scalar- or Vector-Mixer Cals• A.06.0x allows embedding of probe data files during FCA calibration• Perform S-parameter, power-meter, & cal-mixer calibrations in coax• After coax calibrations, reference plane is at probe tipPower-meter andS-parametercalibration planeExtended (de-embedded)measurement planeAdvanced VNA Calibration© Agilent Technologies, Inc. 2006 Page M6- 68.s2pdata
How Do I Get My Probe De-Embedding Data?• Three techniques to measure S-parameter data of probes…– Easiest: use PNA or ENA macro that performs two one-portcalibrations– Measure a thru and then do an adapter-removal calibration– Measure a thru and then do an unknown thru calibration• Using two one-port calibrations…– Assumes probe is reciprocal (S21 = S12)– First one-port calibration uses coaxial standards– Second one-port calibration uses probe standards– Macro extracts .s2p dataof probe using the twoone-port calibrations1. One- port cal hereusing coaxialstandards.s2pdata2. One-port cal hereusing probestandardsAdvanced VNA Calibration© Agilent Technologies, Inc. 2006 Page M6- 69
Page 1 and 2:
Advanced Calibration Techniquesfor
Page 3 and 4:
Agenda• Overview of Calibration
Page 5 and 6:
The Need for CalibrationHow do we g
Page 7 and 8:
Systematic Measurement ErrorsRrecei
Page 9 and 10:
Performing the Calibration: TRL•
Page 11 and 12:
Unknown Thru CalibrationThe “Unkn
Page 13 and 14:
Compromises of Traditional Non-Inse
Page 15 and 16:
Unknown Thru AlgorithmUnknown thru
Page 17 and 18: Two-Port Unknown Thru Calibration S
Page 19 and 20: Unknown Thru Example Using Attenuat
Page 21 and 22: dBCable Movement ErrorCable Movemen
Page 23 and 24: Magnitude (dB)Comparing Unknown and
Page 25 and 26: Measuring Devices with Non-Aligned
Page 27 and 28: 4-Port Unknown Thru with Different
Page 29 and 30: Unknown Thru for Different Waveguid
Page 31 and 32: Traditional Polynomial-Based Models
Page 33 and 34: Calibration Standard Modeling Proce
Page 35 and 36: Benefits of Data-Based Standards•
Page 37 and 38: Data-Based Standard FileCITIFILE A.
Page 39 and 40: Advantage of Measuring More Than 3
Page 41 and 42: Factors That Contribute to Weightin
Page 43 and 44: F lush S hor t d BF lush S hor t P
Page 45 and 46: A irline S hor t d BD eviation f ro
Page 47 and 48: Offset Load Calibration Advantages
Page 49 and 50: DirectMeasurementModelingError Corr
Page 51 and 52: Automatic Port Extensions - Step 1
Page 53 and 54: Measurement ResultsDelay and loss c
Page 55 and 56: Which Standards Should I Use?• Fo
Page 57 and 58: Narrowband APE ExampleAPE with shor
Page 59 and 60: Summary of Automatic Port Extension
Page 61 and 62: Order of Fixturing Operations• Fi
Page 63 and 64: Differential Port MatchingAdvanced
Page 65 and 66: Two-Port De-Embedding.s2p file1 2Fi
Page 67: Two Versus Four Port Embedding /De-
Page 71 and 72: Measuring Probes Using Adapter-Remo
Page 73 and 74: Measuring Probes Using Unknown Thru
Page 75 and 76: What is Electronic Calibration?•
Page 77 and 78: Agilent’s “ECal” Line of Elec
Page 79 and 80: User Characterization: Using Adapte
Page 81 and 82: User Characterization: Applying Fix
Page 83 and 84: Summary (continued)• Two-tier TRL
Page 85 and 86: Additional Resources• Application
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Advanced Calibration Techniques for VNAs

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