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Dependable Memory - Laboratoire Interface Capteurs ...

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8 GENERAL INTRODUCTION<br />

system boundaries to cause catastrophic failures 1 . Consequently, the hardware based concurrent<br />

error detection (CED) has been chosen. To limit the overall cost, we may accept little time penalty in<br />

error correction. In this scenario, the software based rollback is employed. It will reduce the overall<br />

cost as compared to hardware based recovery. Whereas, it will not effect lot to overall performance<br />

because the proposed methodology is suitable for ground applications where occurrence of error is<br />

far less than space.<br />

There is a hypothetical dependable memory (DM) attached to the processor. Moreover, to make<br />

the rollback fast and to simplify the memory management there is an intermediate data storage be-<br />

tween processor and DM. Here, architectural choices are important to make the overall methodology<br />

successful. For-example, the processor core having minimum internal states to be checked (for detect-<br />

ing error) and load and store (for rollback recovery) can make this technique effective (less expensive<br />

and fast). The FT processor has been modeled at VHDL-RTL level. Finally, the processor self check-<br />

ing ability and performance degradation due to re-execution has been tested by artificial error injection<br />

in the simulated model.<br />

The contributions of this work are as follows: Proposing a new methodology based on hard-<br />

ware/software co-design to have a compromise between protection and time/area constrains. For<br />

fast error detection, hardware based concurrent detection is employed. For low hardware overheads,<br />

software based micro-rollback recovery will be used. To reduce the overall area overheads we are em-<br />

ploying stack processor from MISC class. The processor has minimum internal registers which result<br />

in low cost error detection and on the other hand it is suitable for efficient error recovery. Further-<br />

more to mask the error from entering into DM, the intermediate temporal data storage is introduced<br />

between processor and DM.<br />

This thesis is partitioned into six chapters.<br />

Chapter 1: It outline the background and describe the motivation for on-line error detection and<br />

fast correction in embedded microprocessors. It present the basic concepts and the terminologies<br />

related to dependable embedded processor design. It further explores attributes, threats and means<br />

to attain dependability. Lastly, the different dependability techniques applied at different levels are<br />

discussed.<br />

Chapter 2: This chapter will be presenting different redundancy techniques to detect and correct<br />

errors. It explores different FT methodologies employed in the existing fault tolerant processors. The<br />

last part will be dedicated to the validation methodology of a dependable processor.<br />

Chapter 3: This chapter identifies the model specifications and design methodology of the desired<br />

architecture. It address the overall problem by exploring the design paradigm and the related con-<br />

strains of the proposed approach. Later the processor-memory interface will be finalized by different<br />

functional implementations.<br />

Chapter 4: The proposed FT processor has two parts: self-checking processor core (SCPC) and<br />

self-checking hardware journal (SCHJ). This chapter steps towards a design methodology of self-<br />

1 where the cost of harmful consequences is orders of magnitude, or even incommensurably, higher than the benefit<br />

provided by correct service delivery [LRL04]

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