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Dependable Memory - Laboratoire Interface Capteurs ...

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1.7. CONCLUSIONS 29<br />

Ionization<br />

Different<br />

Fault<br />

tolerance<br />

levels<br />

Transient<br />

Current<br />

Sensors<br />

(detectors)<br />

Time redundancy<br />

(detection migration)<br />

Fault<br />

Latency<br />

Transient<br />

Voltage Pulse<br />

Fault Effect<br />

Flip-Flop Error Failure<br />

Hardware Redundancy<br />

Error correction codes<br />

(detection & migration)<br />

Error<br />

Latency<br />

a b c d e<br />

Self checking<br />

mechanism with<br />

recovery<br />

(detection & migration)<br />

Fault Tolerant at level c & d in figure<br />

has been addressed in this thesis<br />

Figure 1.12: Sequence of events from ionization to failure and a set of fault tolerant techniques applied<br />

at different time. [Pie07].<br />

Redundancy/<br />

spare<br />

components

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