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Etude par Sonde Atomique Tomographique de la formation de nano ...

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tel-00751814, version 1 - 14 Nov 2012<br />

Appendixes<br />

Pre<strong>par</strong>ation of the pre-tip. The pre-tip is special tip on which a pow<strong>de</strong>r grain is maintained<br />

(see Figure 4 (a)). Pre-tips are usually ma<strong>de</strong> of tungsten. The electropolishing is performed in<br />

90% H2O and 10% of NaOH electrolyte. In the present case, the “micro-loop” method was<br />

used. Afterwards, in or<strong>de</strong>r to facilitate and insure a better fixation of the pow<strong>de</strong>r grain on the<br />

pre-tip, a “f<strong>la</strong>t area” at the apex of pre-tip is done using the focused ion beam (FIB). The<br />

diameter of the f<strong>la</strong>t area is about 3 to 6 µm.<br />

Fixation of the pow<strong>de</strong>r grain on the pre-tip. This is realized by means of<br />

micromanipu<strong>la</strong>tors (un<strong>de</strong>r optical microscope, see Figure 4 (b)). The pow<strong>de</strong>r grain is fixed on<br />

the pre-tip using special silver glue (see Figure 4 (a)). It should be mentioned that the size of a<br />

pow<strong>de</strong>r grain that will be processed by FIB must not exceed 10 to 13 µm in diameter. Above<br />

these sizes, the milling time is too long.<br />

(a)<br />

Pow<strong>de</strong>r grain<br />

Tungsten pre-tip<br />

Figure 4. (a) Tungsten pre-tip with a pow<strong>de</strong>r grain at the end (b) SEM image of a<br />

micromanipu<strong>la</strong>tor used to fix a pow<strong>de</strong>r grain on the pre-tip.<br />

Milling the final shape by FIB. The pow<strong>de</strong>r is transformed into sharp needle-like tip by<br />

annu<strong>la</strong>r milling FIB. For this final pre<strong>par</strong>ation LEO 1530 and NVISION 40 SEM microscopes<br />

of the GPM <strong>la</strong>boratory were used un<strong>de</strong>r the supervision of F. Cuvilly.<br />

The basic i<strong>de</strong>a of the ion milling using the FIB technique is the following: the sample (pre-<br />

tip) is aligned <strong>par</strong>allel to and centred on the column of the ion beam. The ion beam scan the<br />

end of the specimen in a circu<strong>la</strong>r annu<strong>la</strong>r pattern [1]. A general scheme is shown on Figure 5<br />

(a). The milling is generally performed in a series of stages with successively smaller inner and<br />

outer diameters of the mask and <strong>de</strong>creasing the ion current. Finally, the connection between the<br />

tungsten pre-tip and the pow<strong>de</strong>r <strong>par</strong>ticle (silver glue) is additionally reinforced by the<br />

<strong>de</strong>position of a <strong>la</strong>yer of p<strong>la</strong>tinum, Figure 5 (b).<br />

(b)<br />

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