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Etude par Sonde Atomique Tomographique de la formation de nano ...

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tel-00751814, version 1 - 14 Nov 2012<br />

Appendixes<br />

(a) (b)<br />

Figure 5. (a) FIB principle; (b) SEM image of a pow<strong>de</strong>r at the final stage of annu<strong>la</strong>r<br />

milling without and after Pt (W) reinforcement (done by F. Cuvilly).<br />

d) Specimen pre<strong>par</strong>ation for neutron diffraction experiments<br />

In or<strong>de</strong>r to perform X-ray diffraction experiments on a single pow<strong>de</strong>r <strong>par</strong>ticle of an ODS<br />

mo<strong>de</strong>l alloy, specific specimens were pre<strong>par</strong>ed at GPM. The pre<strong>par</strong>ation inclu<strong>de</strong>s several<br />

stages. They are schematically represented in Figure 6.<br />

Figure 6. Schematic representation of necessary stages for the pre<strong>par</strong>ation of a pow<strong>de</strong>r<br />

grain for X-ray diffraction study.<br />

First, a stainless steel pre-tip with an end radius of few micrometers is pre<strong>par</strong>ed by<br />

electropolishing. The “double <strong>la</strong>yer” method is used.<br />

Second, a Si post with a diameter of 5 µm is stuck by silver glue on the pre-tip using the<br />

micromanipu<strong>la</strong>tor.<br />

Stainless steel<br />

pre-tip<br />

Si post<br />

5 µm<br />

Layer of glue<br />

Stage 1 Stage 2 Stage 3<br />

Pow<strong>de</strong>r grain<br />

(5-10µm)<br />

198

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