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Etude par Sonde Atomique Tomographique de la formation de nano ...

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tel-00751814, version 1 - 14 Nov 2012<br />

Chapter 2. Materials, experimental and simu<strong>la</strong>tion techniques<br />

Another important characteristic of an Atom Probe is its mass resolution. It characterizes<br />

the capability of an instrument to resolve two neighbouring peaks on the mass spectrum. It is<br />

convenient to <strong>de</strong>fine the mass resolution as the ratio between the peak position (in amu) and<br />

the peak width at 10% of its height. Mass resolution <strong>de</strong>pends on the type of AP and on<br />

experimental conditions. This will be discussed in a next section.<br />

II.2. Laser assisted field evaporation<br />

As it was shown in previous section, conventional Atom Probes use electrical pulses in<br />

or<strong>de</strong>r to evaporate surface atoms. In this case, analysis of materials that are brittle un<strong>de</strong>r the<br />

applied electric field (which is the case of ODS and NDS samples obtained from pow<strong>de</strong>r<br />

grains), could be very difficult. In<strong>de</strong>ed, these electrical pulses submit the material to cyclic<br />

stress that frequently leads to the rupture of the specimen [19].<br />

In the 1980`s Tsong and co-wokers <strong>de</strong>signed a pulsed Laser Atom Probe (PLAP) [20,21].<br />

This work was done on the basis of one-dimentional Atom Probe that differs from 3DAP by<br />

much smaller field of view and the use of the <strong>de</strong>tector non sensitive to the position. In the<br />

PLAP, because of duration of Laser pulses (<strong>nano</strong>second or sub<strong>nano</strong>second) the evaporation<br />

field of atoms was strongly thermally assisted. It was shown that the peak temperature of the<br />

specimen un<strong>de</strong>r <strong>nano</strong>second Laser pulse can reach 500 K [22]. In that case, the spatial<br />

resolution has been <strong>de</strong>gra<strong>de</strong>d due to surface diffusion of atoms prior their field evaporation.<br />

Since 2004, a new generation of Atom Probes, using femtosecond Laser pulses have been<br />

<strong>de</strong>veloped in the GPM <strong>la</strong>boratory [19,23]. In this case poor conductive materials (ceramics,<br />

oxi<strong>de</strong> <strong>la</strong>yers, etc…) as well as brittle samples can be analysed [24,25]. Another significant<br />

advantage is the higher mass resolution of the Laser assisted TAP in com<strong>par</strong>ison to electrical<br />

[26].<br />

As it was already mentioned, the evaporation of an atom is assisted either by i) increasing<br />

the electric field at the tip surface (case of applied electrical pulses) or ii) by increasing the<br />

temperature. Since few years, many efforts have been <strong>de</strong>voted to the un<strong>de</strong>rstanding of<br />

physical processes involved in field evaporation un<strong>de</strong>r action of femtosecond Laser. Up to<br />

now, two mo<strong>de</strong>ls are generally accepted:<br />

(i) Thermal pulse mo<strong>de</strong>l (TMP). According to this mo<strong>de</strong>l, a <strong>par</strong>t of the Laser pulse energy<br />

is absorbed in a fine area close to the tip apex, generating a localised thermal spike.<br />

56

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