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Issue 10 Volume 41 May 16, 2003

Issue 10 Volume 41 May 16, 2003

Issue 10 Volume 41 May 16, 2003

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We have investigated and compared material properties and solar cells of several common multicrystalline ingots. Apart<br />

from the contaminated end parts of the ingots the cell quality correlates well with the as-received lifetime, and the lifetime<br />

profile through the ingot correlates with the distribution of defect densities in the material. The asreceived lifetime after light<br />

soaking is a reasonable predictive parameter for cell performance for the complete ingot if the major impurity in the end parts<br />

is iron, and if the oxygen concentration is low. A high oxygen concentration of 15-20 ppma in the bottom parts of some ingots,<br />

instead of the more common 5-<strong>10</strong> ppma for that position, correlates with a strong reduction of cell efficiency.<br />

NTIS<br />

Ingots; Solar Cells; Mechanical Properties<br />

<strong>2003</strong>0036974 Netherlands Energy Research Foundation, Petten<br />

Simple, Detailed and Fast Firing Furnace Temperature Profiling for Improved Efficiency<br />

Hoornstra, J.; van der Heide, A.; Bultman, J.; Weeber, A.; 2002; 8 pp.<br />

Report No.(s): PB<strong>2003</strong>-<strong>10</strong>2653; Copyright; Avail: National Technical Information Service (NTIS)<br />

A new temperature profiling method in a firing furnace is demonstrated. A data logger in a thermal barrier is connected<br />

to a thermocouple traveling through the furnace. The use of smaller and multiple thermocouples attached to a wafer enable<br />

more accurate profiling than the commonly used method. Possibilities for improving the firing furnace could be determined<br />

using the data logger and contact resistance scans made with the Corescan.<br />

NTIS<br />

Temperature Distribution; Furnaces; Energy Conversion; Thermodynamic Effıciency<br />

<strong>2003</strong>0036975 Netherlands Energy Research Foundation, Petten<br />

Locating Losses Due to Contact Resistance, Shunts and Recombination by Potential Mapping with the Corescan<br />

van der Heide, A. S. H.; Bultman, J. H.; Hoornstra, J.; Schoenecker, A.; Wyers, G. P.; Aug. 2002; In English<br />

Report No.(s): PB<strong>2003</strong>-<strong>10</strong>2650; ECN-RX-02-039; Copyright; Avail: National Technical Information Service (NTIS)<br />

A visualization tool to locate losses in a solar cell can be very helpful in troubleshooting a non-optimal production line.<br />

Therefore, the Corescan has been developed, in which three different locating methods are incorporated, the Corescan,<br />

Shuntscan and the new Voc scan. In this paper it is explained how the scan results have to be interpretated and it is shown<br />

that the sensitivity of the methods is more than sufficient. The unique Voc scan method is introduced for the first time; this<br />

technique can locate recombination losses on cells that are almost complete (only the front contact has to be omitted). Several<br />

examples of how the Corescan instrument can be used for troubleshooting and process optimization are presented in this paper.<br />

These examples will help users of the instrument to relate measured scans with reasons for non-optimal processing.<br />

NTIS<br />

Solar Cells; Contact Resistance; Bypasses; Circuits<br />

<strong>2003</strong>0036977 Netherlands Energy Research Foundation, Petten<br />

Selecting Optimal Interconnection Methodology for Easy and Cost Efficient Manufacturing of the Pin Up Module<br />

Bultman, J. H.; Eikelboom, D. W. K.; Kinderman, R. K.; Tip, A. C.; Weeber, A. W.; 2002; 8 pp.<br />

Report No.(s): PB<strong>2003</strong>-<strong>10</strong>2655; Copyright; Avail: National Technical Information Service (NTIS)<br />

Rear contacted solar cells are successfully glued onto an interconnection foil which also serves as the environmental<br />

barrier at the rear of the module. Resulting fill factors are similar to cells connected with strips that are soldered and glued.<br />

Glued cells are interconnected and laminated in a single step, which reduces labor to a minimum, reduces stress on the cells,<br />

and therefore could increase process yield. Considering these advantages, this concept has the potential to interconnect very<br />

thin cells without additional stress on the cells.<br />

NTIS<br />

Costs; Manufacturing; Solar Cells; Joining; Energy Technology; Methodology<br />

<strong>2003</strong>0036979 Netherlands Energy Research Foundation, Petten<br />

PV-Wirefree: Redesigning and Innovating Grid-Connected PV-Systems<br />

Oldenkamp, H.; de Jong, I.; Sinke, W. C.; 2002; 8 pp.<br />

Report No.(s): PB<strong>2003</strong>-<strong>10</strong>2656; Copyright; Avail: National Technical Information Service (NTIS)<br />

In this paper a new concept for designing grid-connected PV-systems is presented: PV-wirefree, aiming at minimizing PV<br />

BOS costs Balance of System costs - and inherently safe PV-systems. The guiding design principles used are: minimize<br />

dc-voltage, minimize components and material, integrate functions, simplify the PV-system and design for easy installation.<br />

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