X-Ray Fluorescence Analytical Techniques - CNSTN : Centre ...
X-Ray Fluorescence Analytical Techniques - CNSTN : Centre ...
X-Ray Fluorescence Analytical Techniques - CNSTN : Centre ...
Create successful ePaper yourself
Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.
SECTION II<br />
ENERGY DISPERSIVE X-RAY FLUORESCENCE<br />
(ED-XRF)<br />
I. Introduction<br />
In Energy Dispersive X-<strong>Ray</strong> <strong>Fluorescence</strong> spectrometry (ED-XRF), the identification of<br />
characteristic lines is performed using detectors that directly measure the energy of the<br />
photons. In the simplest case an electron is ejected from an atom of the detector material by<br />
photoabsorption. The loss of energy of this just created primary electron results in a shower of<br />
electron-ion pairs in the case of a proportional counter, optical excitations in the case of<br />
scintillation counter, or showers of electron-hole pairs in a semiconductor detector. The<br />
resulting detector signal is proportional to the energy of the incident photon, in contrast to<br />
wavelength dispersion in which the Bragg reflecting properties of a crystal are used to<br />
disperse X-rays at different reflection angles according to their wavelengths. Although energy<br />
dispersive detectors generally exhibit poorer energy resolution than wavelength dispersive<br />
analyzers, they are capable of detecting simultaneously a wide range of energies.<br />
The most frequently used detector in EDXRF is the silicon semiconductor detector,<br />
which nowadays can have excellent energy resolution. The two other types of detectors,<br />
mentioned above, with their poorer energy resolution are limited to special cases where<br />
certain features of semiconductors are not acceptable. Also the germanium semiconductor<br />
detector with its comparable characteristics has a major drawback for conventional XRF:<br />
inherently the escape peaks of intense lines can obscure other lines of interest.<br />
II. Instrumentation<br />
An ED-XRF system consists of several basic functional components, as shown in<br />
Figure II.1: an –ray excitation source, sample chamber, Si(Li) detector, preamplifier, main<br />
amplifier and mutlichannel pulse height analyzer. The properties and performances of an ED-<br />
XRF system differ upon the electronics and the enhancements from the computer.<br />
Figure II.1: Typical ED-XRF detection arrangement.