X-Ray Fluorescence Analytical Techniques - CNSTN : Centre ...
X-Ray Fluorescence Analytical Techniques - CNSTN : Centre ...
X-Ray Fluorescence Analytical Techniques - CNSTN : Centre ...
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Cr 1.2 16 Sn 4.8 (Lα) 8<br />
Mn 2.6 12 Sb 7.1 (Lβ) 8<br />
Fe 2.2 12 Te 10<br />
Co 6.0 I 13<br />
Ni 6.0 5 Cs 24<br />
Cu 4.8 6 Ba 5.1 (Lα) 40<br />
Zn 5 Hg 7 (Lα)<br />
Ga 4 Pb 21 (Mα) 8 (Lα)<br />
II. Disturbing Effects<br />
II.1 Interelement Radiation<br />
By the term “interelements” we mean those elements in the sample which become<br />
excited together with the wanted element under the influence of the primary radiation of the<br />
source. The fluorescent radiation of interelements may disturb X-ray fluorescence<br />
determination of the element of interest, or even make it completely impossible. These<br />
disturbing effects can be classified as follows:<br />
1. The K-series peak of the wanted element partially overlaps the K-series peaks of<br />
interelements. Remember that if the difference between the atomic numbers of two<br />
elements is lower than 3 (∆Z < 3), their characteristic peaks can be separated only by means<br />
of a solid-state detector (Si(Li)) or appropriate absorption-edge filters.<br />
2. The K-series peak of the wanted element overlaps the L-series peaks of some of the<br />
interelements. As an example, let us consider zinc determination (ZnKα = 8.64 keV) in a<br />
sample which also contains tungsten (WLα = 8.39 keV). From the energy values of the<br />
ZnKα and WLα lines it is evident that the complete separation of two peaks may be a hard<br />
task even if a solid-state detector is used.<br />
3. The characteristic peak of the wanted overlaps the escape peaks of interelements. An<br />
example of such a situation is the determination of vanadium (VKα = 17.47 keV) in a<br />
sample which also contains tungsten (WLα = 8.39 keV).<br />
It follows from these examples that the choice of optimum measurement conditions for<br />
X-ray fluorescence determination of a particular element in a given material requires<br />
information concerning the latter’s chemical composition and expected concentration ranges<br />
of all the sample constituents in every analysed sample.<br />
II.2 Matrix Effects<br />
Generally speaking, the matrix effects in X-ray fluorescence analysis result from the<br />
influence of the variations of chemical compositions of the sample matrix on the fluorescent<br />
intensity of the wanted element. These effects can manifest themselves either via a difference<br />
in the absorption of both the primary and fluorescence radiations in samples of different<br />
matrix composition (absorption effect) or via an increase of the radiation intensity<br />
(enhancement effect) due to the fluorescence radiation of some of the interelements. These<br />
two phenomena will be discussed in detail in subsequent sections. The elements whose<br />
varying concentrations in the analysed samples lead to the effects mentioned above will be<br />
called disturbing elements.