X-Ray Fluorescence Analytical Techniques - CNSTN : Centre ...
X-Ray Fluorescence Analytical Techniques - CNSTN : Centre ...
X-Ray Fluorescence Analytical Techniques - CNSTN : Centre ...
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E is the photon energy, ε is the average energy required to produce a free electron-hole pair, F<br />
is the FANO factor and 2.35 converts the root means square deviation to FWHM. For an<br />
equivalent energy, the detector contribution to the resolution is 28 % less for the case of Ge<br />
compared to Si.<br />
The contribution to resolution associated with electronic noise (∆Eelec) is the result of<br />
random fluctuations in thermally generated leakage currents within the detector and in the<br />
early stages of the amplifier components.<br />
III. Spectrum Evaluation<br />
Spectrum evaluation in energy dispersive XRF is certainly more critical than in WD-<br />
XRF, because of the relatively low resolution of the solid-state detectors employed. The aim<br />
is the extraction of the analytically relevant information (net number of counts under a peak)<br />
from experimental spectra.<br />
In EDXRF, the characteristic radiation of a particular line can be described in an<br />
adequate first-order approximation by a Gaussian function (detector response function). The<br />
spectral background results a variety of processes: for photon excitation, the main<br />
contribution is the incoherently scattered primary radiation and therefore depends on the<br />
shape of the excitation spectrum and on the sample composition. For particle-induced X-ray<br />
emission and electron excitation, the background observed is mainly due to Bremsstrahlung.<br />
The most straightforward method to obtain the net data area under a line of interest<br />
consists of interpolating the background under the peak and summing the backgroundcorrected<br />
channel contents in a window over the peak. In practice, this approach is limited by<br />
the curvature of the background and by the presence of other peaks and can therefore not be<br />
used as a general tool for spectrum processing in EDXRF. An example of overlapping peaks<br />
is the analysis of lead and arsenic simultaneously present in a sample (Figure II.7).<br />
Figure II.7: A spectrum of As K, overlapped with a Pb L line spectrum, both excited by<br />
a Mo X-ray tube, under identical conditions. The energy of AsKα1,2 (10.53<br />
keV) and Pb Lα1,2 (10.55 keV) cannot be separated by an Si(Li) detector.