X-Ray Fluorescence Analytical Techniques - CNSTN : Centre ...
X-Ray Fluorescence Analytical Techniques - CNSTN : Centre ...
X-Ray Fluorescence Analytical Techniques - CNSTN : Centre ...
Create successful ePaper yourself
Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.
IV.2 Compton Edge<br />
Figure II.8: Escape effect.<br />
At low energy of the spectrum lies the Compton shoulder. This rise in the background is<br />
caused by high-energy photons incoherently scattered from the front side of the detector<br />
crystal, leaving only a small fraction of their energy with the recoiled Compton electron in the<br />
detector (Figure II.9). The energy at which the Compton edge occurs is given by the formular<br />
beneath. Both the detector resolution and multiple scattering tend to smear out this sharp<br />
edge.<br />
IV.3 Resulting Spectral Background<br />
Figure II.9: Compton edge.<br />
Figure II.10 shows the spectrum obtained by monochromatic excitation of 17.5 keV and<br />
a Si(Li) detector. The width of the coherent scatter peak reflects the detector resolution at 7.4<br />
keV. The incoherent peak is much broader due to the range of scattering angles included<br />
about the nominal 90° scattering angle. The low energy tail on the incoherent peak extending<br />
down to about 10 keV is primarily due to multiple Compton scattering in the specimen.<br />
The major background represented by the cross-hatched area, is due to incomplete<br />
charge collection in the Si(Li) detector. This occurs when a portion of the positive and<br />
negative charges produced in the detector by the 16.8 and 17.4 keV photons recombine before<br />
they are collected. The result is a pulse of abnormally low amplitude recorded at a lower than<br />
normal energy. The intensity of background due to incomplete charge collection is a function<br />
of detector quality and X-ray energy.