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X-Ray Fluorescence Analytical Techniques - CNSTN : Centre ...

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each other. If the amplification condition “phase difference = a whole multiple of the<br />

wavelength” (∆λ = nλ) is not precisely met, the reflected wave will interfere such that<br />

cancellation occurs. All that remains is the wavelength for which the amplification condition<br />

is met precisely. For a defined wavelength and a defined lattice plane distance, this is only<br />

given with a specific angle, the Bragg angle (Figure IV.6).<br />

Figure IV.6: Bragg’s Law.<br />

Under amplification conditions, parallel, coherent X-ray light (1,2) falls on a crystal<br />

with a lattice plane distanced ‘d’ and is scattered below the angle θ (1′,2′). The proportion of<br />

the beam that is scattered on the second plane has a difference of ‘ACB’ to the proportion of<br />

the beam that was scattered at the first plane.<br />

The amplification condition is fulfilled when the phase difference is a whole multiple of<br />

the wavelength λ. This results in Bragg’s Law:<br />

2dsinθ= nλ;<br />

(IV.2)<br />

n = 1, 2, 3… Reflection order.<br />

On the basis of Bragg’s Law, by measuring the angle θ, you can determine either the<br />

wavelength λ, and thus chemical elements, if the lattice plane distance ‘d’ is known or, if the<br />

wavelength λ is known, the lattice plane –value distance ‘d’ and thus the crystalline structure.<br />

This provides the basis for two measuring techniques for the quantitative and qualitative<br />

determination of chemical elements (XRF) and crystalline structures (molecules, XRD),<br />

depending on whether the wavelength λ or the 2d-vale is identified by measuring the angle θ<br />

(Table IV.1).<br />

Table IV.1: Wavelength dispersive X-ray techniques.<br />

Known Sought Measured Method Instrument type<br />

d λ θ X-ray fluorescence Spectrometer<br />

λ d θ X-ray diffraction Diffractometer<br />

In X-ray diffraction (XRD) the sample is excited with monochromatic radiation of a<br />

known wavelength (λ) in order to evaluate the lattice plane distance as per Bragg’s equation.<br />

In XRF, the ‘d’-value of the analyzer crystal is known and we can solve Bragg’s<br />

equation for the element characteristic wavelength (λ).

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