X-Ray Fluorescence Analytical Techniques - CNSTN : Centre ...

II.4 Energy Resolution
III. Spectrum Evaluation
IV. Detector Artefacts
IV.1 Escape Peaks
IV.2 Compton Edge
IV.3 Resulting Spectral Background
V. The Approach to Quantification in EDXRF Analysis
V.1 Thin Samples Technique
V.2 Intermediate Thickness Samples
V.3 Infinitely Thick Samples
SECTION III: Total Reflexion X-Ray Fluorescence (TXRF)
I. Introduction
II. Advantages of TXRF
III. Principle of Total Reflection X-Ray Fluorescence Analysis
IV. Instrumentation
IV.1 Excitation Sources for TXRF
IV.2 Sample Reflectors
IV.3 Detectors
V. Quantification
VI. Influence on Detection Limits
VII. General Sample Preparation
VIII. Application of TXRF
SECTION IV: Wavelength Dispersive X-Ray Fluorescence (WD-XRF)
I. Introduction
II. Principle of WD-XRF
II.1 Collimator Masks
II.2 Collimator
II.3 Analyzing Crystals
II.3.1 Bragg’s Law
II.3.2 Reflections of Higher Orders
II.3.3 Crystal Types
II.3.4 Dispersion, Line Separation
II.3.5 Synthetic Multilayers
II.4 Detectors