X-Ray Fluorescence Analytical Techniques - CNSTN : Centre ...
X-Ray Fluorescence Analytical Techniques - CNSTN : Centre ...
X-Ray Fluorescence Analytical Techniques - CNSTN : Centre ...
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fluoresced X-ray intensity from a multi-element specimen subjected to a monochromatic nondivergent<br />
incident radiation of energy E that only accounted for primary absorption:<br />
S Ω Cg i i Ei Ii i E<br />
Ii<br />
=<br />
4πsinψ1µ i<br />
+<br />
sin ψ1 sin ψ2<br />
κ ( , ) µ ( )<br />
, (VI.5)<br />
( E)<br />
µ ( E )<br />
where:<br />
Ii: Intensity of observed characteristic line of element i.<br />
E: Energy of incident radiation.<br />
Ei: Energy of the characteristic line of element i being measured.<br />
S: Irradiated surface area of specimen.<br />
Ci: Concentration of element i in the specimen.<br />
gi: Proportionality constant for characteristic line of element i.<br />
ψ1: Angle between the specimen surface and the incident x-rays.<br />
ψ2: Angle between the specimen surface and the detector.<br />
Ω: Solid angle subtended by the detector.<br />
κ(Ei,Ii): Response of instrument at energy Ei of characteristic line energy of element i.<br />
µi(E): Mass absorption coefficient of element i at incident energy E.<br />
µ(E): Total absorption coefficient of specimen at incident energy E.<br />
µ(Ei): Total absorption coefficient of specimen at characteristic line energy of element i.<br />
Also note that:<br />
( E) ∑C<br />
( E)<br />
µ = j µ j . (VI.6)<br />
j<br />
Sherman later developed his theory to express the emitted X-ray intensity from a multielement<br />
specimen subjected to a polychromatic radiation source. Sherman’s theory was then<br />
further refined by Shiraiwa and Fujino:<br />
⎧<br />
⎪<br />
J 1 E<br />
i − S Ω ⎪ max<br />
τi<br />
( E)<br />
Ji−1<br />
Ii = κ ( Ei, Ii) Cipiω( )<br />
4 sin i ⎨ ∫ Io E dE + Cjpjωj∑ Jiπ ψ1 ⎪ Eiedge µ ( E)<br />
µ ( Ei<br />
)<br />
j 2Ji<br />
+<br />
⎩<br />
⎪ sin ψ1 sin ψ2<br />
Emax τi( Ej) τ j ( E) ⎡ ⎛<br />
sin 1 ( E)<br />
⎞ ⎛<br />
sin 2<br />
( Ei<br />
) ⎞⎤<br />
⎫<br />
ψ µ<br />
ψ µ<br />
⎪<br />
∫<br />
• ⎢ ln ⎜1+ ⎟+ ln ⎜1+ ⎟⎥<br />
dE⎬<br />
Eiedge µ ( E) µ ( Ei<br />
) ⎢µ ( E) ⎜ µ ( Ej) sin ψ ⎟ µ<br />
1 ( Ei)<br />
⎜ µ ( Ej)<br />
sin ψ ⎟⎥<br />
+ ⎢ 2<br />
⎣ ⎝ ⎠ ⎝ ⎠⎥⎦<br />
⎪<br />
⎭<br />
sin ψ1 sin ψ2<br />
, (VI.7)<br />
where;<br />
Ji: Jump ratio of the photoelectric mass absorption coefficient at the absorption edge for the<br />
line of element i being measured.<br />
ωi: Fluorescent yield for the line of element i being measured.<br />
Io(E): Intensity of incident radiation at energy E.<br />
τi(E): Mass photoabsorption coefficient of element i at incident energy E.<br />
τi(Ei): Mass photoabsorption coefficient of element i at energy Ei of characteristic line<br />
energy of element i.<br />
pi: Transition probability of observed line of element i.<br />
Ei edge: Energy of the absorption edge of the characteristic line of element i.<br />
Emax: Maximum energy of the incident radiation.