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X-Ray Fluorescence Analytical Techniques - CNSTN : Centre ...

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fluoresced X-ray intensity from a multi-element specimen subjected to a monochromatic nondivergent<br />

incident radiation of energy E that only accounted for primary absorption:<br />

S Ω Cg i i Ei Ii i E<br />

Ii<br />

=<br />

4πsinψ1µ i<br />

+<br />

sin ψ1 sin ψ2<br />

κ ( , ) µ ( )<br />

, (VI.5)<br />

( E)<br />

µ ( E )<br />

where:<br />

Ii: Intensity of observed characteristic line of element i.<br />

E: Energy of incident radiation.<br />

Ei: Energy of the characteristic line of element i being measured.<br />

S: Irradiated surface area of specimen.<br />

Ci: Concentration of element i in the specimen.<br />

gi: Proportionality constant for characteristic line of element i.<br />

ψ1: Angle between the specimen surface and the incident x-rays.<br />

ψ2: Angle between the specimen surface and the detector.<br />

Ω: Solid angle subtended by the detector.<br />

κ(Ei,Ii): Response of instrument at energy Ei of characteristic line energy of element i.<br />

µi(E): Mass absorption coefficient of element i at incident energy E.<br />

µ(E): Total absorption coefficient of specimen at incident energy E.<br />

µ(Ei): Total absorption coefficient of specimen at characteristic line energy of element i.<br />

Also note that:<br />

( E) ∑C<br />

( E)<br />

µ = j µ j . (VI.6)<br />

j<br />

Sherman later developed his theory to express the emitted X-ray intensity from a multielement<br />

specimen subjected to a polychromatic radiation source. Sherman’s theory was then<br />

further refined by Shiraiwa and Fujino:<br />

⎧<br />

⎪<br />

J 1 E<br />

i − S Ω ⎪ max<br />

τi<br />

( E)<br />

Ji−1<br />

Ii = κ ( Ei, Ii) Cipiω( )<br />

4 sin i ⎨ ∫ Io E dE + Cjpjωj∑ Jiπ ψ1 ⎪ Eiedge µ ( E)<br />

µ ( Ei<br />

)<br />

j 2Ji<br />

+<br />

⎩<br />

⎪ sin ψ1 sin ψ2<br />

Emax τi( Ej) τ j ( E) ⎡ ⎛<br />

sin 1 ( E)<br />

⎞ ⎛<br />

sin 2<br />

( Ei<br />

) ⎞⎤<br />

⎫<br />

ψ µ<br />

ψ µ<br />

⎪<br />

∫<br />

• ⎢ ln ⎜1+ ⎟+ ln ⎜1+ ⎟⎥<br />

dE⎬<br />

Eiedge µ ( E) µ ( Ei<br />

) ⎢µ ( E) ⎜ µ ( Ej) sin ψ ⎟ µ<br />

1 ( Ei)<br />

⎜ µ ( Ej)<br />

sin ψ ⎟⎥<br />

+ ⎢ 2<br />

⎣ ⎝ ⎠ ⎝ ⎠⎥⎦<br />

⎪<br />

⎭<br />

sin ψ1 sin ψ2<br />

, (VI.7)<br />

where;<br />

Ji: Jump ratio of the photoelectric mass absorption coefficient at the absorption edge for the<br />

line of element i being measured.<br />

ωi: Fluorescent yield for the line of element i being measured.<br />

Io(E): Intensity of incident radiation at energy E.<br />

τi(E): Mass photoabsorption coefficient of element i at incident energy E.<br />

τi(Ei): Mass photoabsorption coefficient of element i at energy Ei of characteristic line<br />

energy of element i.<br />

pi: Transition probability of observed line of element i.<br />

Ei edge: Energy of the absorption edge of the characteristic line of element i.<br />

Emax: Maximum energy of the incident radiation.

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