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X-Ray Fluorescence Analytical Techniques - CNSTN : Centre ...

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just above the absorption edges of the elements of interest in the sample. Therefore, secondary<br />

target excitation has some obvious advantages over direct tube excitation: its flexibility for<br />

getting an optimized and near monochromatic excitation providing a better selectivity and an<br />

improved sensitivity. However, to compensate for the intensity losses that occur at the<br />

secondary scatterer, a high-powered tube as used in WD spectrometers is required; making<br />

the whole system more sophisticated and expensive compared to direct tube excitation setups.<br />

II.1.3 Radio-Isotopic Excitation<br />

Radio-isotopic sources are simple, cheap and quasi-monochromatic excitation sources.<br />

They are very suitable sources when combined with a solid state detector for in situ analysis<br />

(Figure II.3).<br />

Figure II.3: Geometry of an EDXRF spectrometer with annular source excitation.<br />

A variety of about 30 commercially available radio-isotopic materials can be chosen for<br />

an optimal excitation. The X-rays and/or γ-rays emitted from these radio-isotopic sources<br />

cover a wide range (10 – 60 keV) of excitation energies. With a high energy source like 241<br />

Am, K lines instead L lines can be used for quantification in the case of analyzing high-Z rare<br />

earth elements, with considerably less matrix effects and spectrum overlaps. Sometimes the<br />

same idea as in the secondary target excitation is used to avoid non-photon radiation. A<br />

proper design of excitation-detection geometry can improve greatly the sensitivity and<br />

accuracy of the XRF analysis with such excitation source. The disadvantages of using radioisotopic<br />

sources however lie in their low photon output, intensity decay and storage problems.<br />

II.2 Detectors<br />

The selective determination of elements in a mixture, using X-ray spectrometry,<br />

depends upon resolving the spectral lines emitted by the various elements into separate<br />

components. This process requires some form of energy sorting or wavelength dispersing<br />

device. In the case of wavelength dispersive X-ray spectrometers, this is accomplished by the<br />

analyzing crystal, which requires mechanical movement to select each desired wavelength<br />

according to Bragg’s Law. Optionally, several fixed-crystal channels may be used for<br />

simultaneous measurements. In contrast, energy dispersive X-ray spectrometry is based upon<br />

the ability of the detector to create signals proportional to the X-ray photon energy, therefore,<br />

mechanical devices, such as analyzing crystals, are not required. Several types of detectors<br />

have been employed, including silicon, germanium and mercuric iodide.<br />

The solid state, lithium-drifted silicon detector, Si(Li), was developed and applied to Xray<br />

detection in the 1960’s. By the early 1970’s, this detector was firmly established in the<br />

field of X-ray spectrometry, and was applied as an X-ray detection system for scanning

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