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REVISTA ROMÂNĂ DE AUTOMATICĂ - IPA SA

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<strong>REVISTA</strong> ROMÂNĂ <strong>DE</strong> AUTOMATICĂ<br />

37<br />

5. Conclusions<br />

The quality analysis and tombstoning<br />

appearances situations demonstrated that the<br />

type 2 and 3 apertures assure solder paste on<br />

pads in excess. As upshot the wetting angle<br />

of solder joints are close to 90°, the limit of<br />

quality acceptance. Also, the solder paste in<br />

excess offers condition for spread solder balls<br />

on pcb surface. The theoretical analysis and<br />

practical results show the importance of<br />

solder paste deposit’s axial dimension<br />

compared to chip component axial dimension<br />

as a tombstoning factor.<br />

Based on the practical results of experiments,<br />

the generally accepted criteria for a chip,<br />

component solder adequacy, the joint should<br />

extend up the component termination for a<br />

minimum of one-third of the component<br />

height, or 0.4 mm, whichever is less, the<br />

tolerance of chip components cases, the<br />

variability of pad dimensions, the authors are<br />

proposing the following requirements for<br />

stencil design regarding chip components<br />

assembling in vapour phase technology:<br />

radial apertures dimension, Xa :<br />

Xa = W+H (4)<br />

axial apertures dimension, Ya :<br />

Cp – Ya = S, Cp + Ya = L=T, Ya = (L+T) /<br />

2 (5)<br />

stencil thickness: 0.125mm<br />

As a result, the team defined the necessary<br />

criteria in order to obtain optimum thermal<br />

profile by measuring temperatures directly on<br />

pcb surface: preheating with 1.4 °C/s until<br />

185-190°C and go to range of melting point<br />

with 0.66 °C/s until maximum temperature<br />

230 °C.<br />

References<br />

[1] T. C. Cucu, N.D.Codreanu, I. Plotog,<br />

"Reflow process using lead free materialsbasics<br />

and comparison with tin-lead process",<br />

Proceedings of the 2005 Interntional<br />

Symposium for Design Technology and<br />

Electronics Packaging (SIITME 2005), Cluj-<br />

Napoca, Romania, September 22-25, 2005,<br />

pp. 250 - 255.<br />

[2] I. Plotog, S. Jianu, C. Turcu, T. C. Cucu,<br />

N.D.Codreanu, “Multi-criterial Approach for<br />

Implementing of Lead-free Technology”, 4th<br />

European Microelectronics and Packaging<br />

Symposium, May 21-24, Terme Catez,<br />

Slovenia, pp. 301-306.<br />

[3] I Plotog, S. Jianu, C. Turcu, A. Stan,<br />

T.C.Cucu, N.D.Codreanu, DFM Concept for<br />

Wave Soldering Technology, SIITME 2006,<br />

Iasi, September 2006 Romania<br />

[4] Klein Wassink, Soldering in Electronics<br />

(2nd Edition), Electrochemical Publications,<br />

Port Erin, Isle of Man, Great Britain, 1989<br />

[5] S. Jianu, I. Plotog, C.Turcu, A. Stan,<br />

T.C.Cucu, N.D.Codreanu, Reliability Aspects<br />

for optimal Implementation of Lead-free<br />

Technology, SIITME 2006, Iasi, September<br />

2006 Romania<br />

[6] ***, Internet web sites related to<br />

DFM topics.<br />

[7] ***, www.ipc.org<br />

AR4-7.doc

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